Abstract
A definition of the concept of effective wavelengths(λeff) is given, and the need to know these when operating with photometers is pointed out. Possible methods of determining λeff other problems that arise when measuring reflectances on photometers, that have been insufficiently discussed in the literature, are considered in detail.
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References
A. I. Rymov, Lacquer Coloring Materials and Their Application, No. 2, 55 (1964).
GOST 7690-76, Cellulose, Paper, and Cardboard. Method of Determining Whiteness.
GOST 18054-72, Textile Materials. Method of Determining Whiteness.
GOST 24768-81, Porcelain Vessels. Method of Determining Whiteness.
E. I. Goritskii, Opt.-Mekh. Prom., No. 5, 3 (1990).
E. I. Goritskii and N. A. Voishvillo, Opt.-Mekh. Prom., No. 12, 26 (1985).
E. I. Goritskii, Opt.-Mekh. Prom., No. 7, 47 (1988).
N. I. Kaminskaya et al, Izmer. Tekh., No. 2, 61 (1970).
E. I. Goritskii and N. A. Voishvillo, Opt.-Mekh. Prom., No. 2, 9 (1987).
GOST 16263-70, Metrology. Terms and Definitions.
V. A. Fass, Optical Filters [in Russian], Kinofotoizdat, Moscow (1936).
D. Judd and G. Vyshetski, Light in Science and Technology, [Russian translation], Mir, Moscow (1978).
MI 68-75, A Method of Checking Zeiss Leicometers.
MI 31-75, A Method of Checking Specimens of White Surfaces.
Additional information
Translated from Izmeritel'naya Tekhnika, No. 8, pp. 26–30, August, 1993.
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Goritskii, E.I. Theory and practice of measurements of the reflectances of light-scattering materials based on simplified vapor spectrophotometers with zone filters. Meas Tech 36, 881–887 (1993). https://doi.org/10.1007/BF00983984
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DOI: https://doi.org/10.1007/BF00983984