The optimistic update theorem for path delay testing in sequential circuits

Abstract

For sequential circuit path delay testing, we propose a new update rule for state variables whereby flipflops are updated with their correct values provided they are destinations of at least one robustly activated path delay fault. Existing algorithms in the literature, for robust fault simulation and test generation, assign unknown values to off-path latches that have non-steady signals at their inputs in the previous vector. Such procedures are pessimistic and predict low fault coverages. They also have an adverse effect on the execution time of fault simulation especially if the circuit has a large number of active paths. The proposed update rule avoids these problems and yet guarantees robustness.