Abstract
Let a circuit havem outputs,m>1. There are two ways to test this circuit by means of a signature analyzer: use a single input analyzer for each output or use anm-input analyzer to test all outputs simultaneously. The main goal of this letter is to demonstrate that for fault output sequences with small multiplicity of errors and long length the second approach is more effective.
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References
P.H. Bardell, W.H. McAnney, and J. Savir,Built-in Test for VLSI: Pseudorandom Techniques. John Wiley & Sons, Inc., New York, 1987.
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Stolov, Y.L. Testing of multi-output circuits by means of signature analyzer. J Electron Test 4, 283 (1993). https://doi.org/10.1007/BF00971976
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DOI: https://doi.org/10.1007/BF00971976