Abstract
A Booth multiplier is the most widely used type of multiplier. In this article, the testability issues involved in its design are discussed. In contrast to previous work, the fault model includes not only node stuck-at faults, but also transistor stuck-open and stuck-close faults. Moreover, as a result of adopting a hierarchical testability approach, the designed Booth multiplier turns out to be fully C-testable. To achieve this C-testability, only three additional controllable inputs are required, which results in a negligible area and delay overhead.
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Van Sas, J., Nowé, C., Pollet, D. et al. Design of a C-testable booth multiplier using a realistic fault model. J Electron Test 5, 29–41 (1994). https://doi.org/10.1007/BF00971961
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DOI: https://doi.org/10.1007/BF00971961