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Simplified x-ray diffraction method for determining the framework composition of high-silica faujasites

  • Physical Chemistry
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Bulletin of the Academy of Sciences of the USSR, Division of chemical science Aims and scope

Conclusions

The x-ray diffractograms of high-silica Y zeolites have four reflections whose relative intensities correlate with the framework composition, and this relationship can be used to evaluate the Si/Al ratio in Y zeolites.

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Authors and Affiliations

  1. N. D. Zelinskii Institute of Organic Chemistry, Academy of Sciences of the USSR, Moscow

    I. V. Mishin, H. K. Beyer, G. A. Ashavskaya, V. D. Nissenbaum & G. M. Kutateladze

  2. Central Institute of Chemical Research, Academy of Sciences of Hungary, Budapest

    I. V. Mishin, H. K. Beyer, G. A. Ashavskaya, V. D. Nissenbaum & G. M. Kutateladze

Authors
  1. I. V. Mishin
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  2. H. K. Beyer
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  3. G. A. Ashavskaya
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  4. V. D. Nissenbaum
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  5. G. M. Kutateladze
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Additional information

Translated from Izvestiya Akademii Nauk SSSR, Seriya Khimicheskaya, No. 7, pp. 1497–1501, July, 1988.

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Mishin, I.V., Beyer, H.K., Ashavskaya, G.A. et al. Simplified x-ray diffraction method for determining the framework composition of high-silica faujasites. Russ Chem Bull 37, 1321–1324 (1988). https://doi.org/10.1007/BF00962730

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  • DOI: https://doi.org/10.1007/BF00962730

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