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On the possibility of elemental analysis of solid crystals by the X-ray diffraction method

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Abstract

A new method of elemental analysis of solid crystals by the X-ray diffraction method is proposed. The possibility of application of this method to multicomponent polymorphic systems (including a wide range of elements being analyzed and quantitative determination of their mass concentrations without using an external or internal standard) is demonstrated for natural aluminum silicate and titanium oxide samples as examples.

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Authors and Affiliations

  1. Herzen Russian State Pedagogical University, nab. reki Moiki 48, St. Petersburg, 191186, Russia

    V. M. Stozharov

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  1. V. M. Stozharov
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Correspondence to V. M. Stozharov.

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Original Russian Text © V.M. Stozharov, 2014, published in Zhurnal Tekhnicheskoi Fiziki, 2014, Vol. 84, No. 10, pp. 48–50.

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Stozharov, V.M. On the possibility of elemental analysis of solid crystals by the X-ray diffraction method. Tech. Phys. 59, 1466–1469 (2014). https://doi.org/10.1134/S1063784214100302

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  • DOI: https://doi.org/10.1134/S1063784214100302

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