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Advances in the optical analysis of semiconductor materials

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Abstract

Recent progress is reviewed for optical techniques of semiconductor materials characterization. Luminescence is emphasized because of its inherently high sensitivity to detect impurities and imperfections, especially in the presently best understood compounds GaAs and GaP. Examples are discussed for optical determination of mechanical stresses, the effect of dislocations, dopant inhomogeneities and compensation ratio, carrier relaxation and electron drift mobilities, as well as energy transfer processes.

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Queisser, H.J. Advances in the optical analysis of semiconductor materials. Appl. Phys. 10, 275–288 (1976). https://doi.org/10.1007/BF00920611

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