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The influence of intrisic defects on the degradation and luminescence of GaAs and other III–V compounds

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Abstract

A significant contribution to the degradation of GaAs-based lasers and light-emitting diodes arises from the formation of so-called dark line defects. It is shown that these defects are accumulations of non-radiative recombination centres around dislocations. The centres are identified as As vacancies, which are emitted by climbing dislocations, concomitantly with the absorption of Ga interstitials. From scanning deep-level transient spectroscopy observations it is concluded that the so-called DX centres are Ga interstitials. The driving force for dislocation climb and thus for dark-line-defect formation is a supersaturation of Ga interstitials originating from the growth of the GaAs crystals under Ga-rich conditions as a consequence of the high volatility of As. Phenomena in other III–V compound semiconductors related to the formation of dark line defects in GaAs are also discussed.

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References

  1. P.Petroff, R.L.Hartman: Appl. Phys. Lett.23, 469 (1973)

    Article  Google Scholar 

  2. P.W.Hutchinson, P.S.Dobson: Philos. Mag.32, 745 (1975)

    Google Scholar 

  3. J.Matsui, K.Ishida, Y.Nannichi: Jpn. J. Appl. Phys.14, 1555 (1975)

    Article  Google Scholar 

  4. L.C.Kimerling: Solid-State Electron21, 1319 (1978)

    Article  Google Scholar 

  5. P.W.Hutchinson, P.S.Dobson, B.Wakefield, S.O'Hara: Solid-State Electron.21, 1413 (1978)

    Article  Google Scholar 

  6. A.K.Chin, V.G.Keramidas, W.D.Johnston,Jr., S.Mahajan, D.D.Roccasecca: J. Appl. Phys.51, 978 (1980)

    Article  ADS  Google Scholar 

  7. A.T.Vink, C.J.Werkhoven C.van Opdorp:Semiconductor Characterization Techniques ed. by P.A.Barnes, G.A.Rozgonyi (Electrochemical Society, Princeton 1978) p. 259

    Google Scholar 

  8. C.Werkhoven, C.van Opdorp, A.T.Vink: Philips Tech. Rundschau38, 33 (1979)

    Google Scholar 

  9. K.Böhm, B.Fischer: J. Appl. Phys.50, 5453 (1979)

    Article  ADS  Google Scholar 

  10. C.Werkhoven, J.H.T.Hengst, C.van Opdorp: Appl. Phys. Lett.35, 136 (1979)

    Article  ADS  Google Scholar 

  11. K.Böhm: Ph.D. thesis, University of Stuttgart, (1978)

  12. L.J.Balk, E.Kubalek, E.Menzel:Scanning Electron Microscopy 1976, Part I, Proc 9th Annual Scanning, Electron Microscope Symposium (IIT Research Institute, Chicago 1976), p. 257

    Google Scholar 

  13. H.C.Casey,Jr.: J. Electrochem. Soc.114, 153 (1967).

    Google Scholar 

  14. P.M. Petroff, A.Savage: Proc. Royal Microscopical Society, vol.14/2 (Oxford 1979) paper 14

  15. U.Gösele, W.Frank: Proc. Intern. Conf. on Radiation Physics of Semiconductors and Related materials (Tbilisi 1979), in press

  16. A.Seeger:Encyclopedia of Physics Vol. 7, Part 1, ed. by S.Flügge (Springer, Berlin, Göttingen, Heidelberg 1955) p. 383

    Google Scholar 

  17. J.Friedel:Les Dislocations (Gautier Villars, Paris 1956)

    Google Scholar 

  18. P.M.Petroff, L.C.Kimerling: Appl. Phys. Lett.29, 461 (1976)

    Article  ADS  Google Scholar 

  19. G.Zaeschmar, R.S.Speer: J. Appl. Phys.50, 5686 (1979)

    Article  ADS  Google Scholar 

  20. D.V.Lang, P.M.Petroff, R.A.Logan, W.D.Johnston,Jr.: Phys. Rev. Lett.42, 1353 (1979)

    Article  ADS  Google Scholar 

  21. P.M.Petroff: J. Physique40, C6–201 (1979)

    Google Scholar 

  22. J.R.Arthur: J. Phys. Chem. Solids28, 2257 (1967)

    Article  Google Scholar 

  23. C.T.Foxon, J.A.Harvey, B.A.Joyce: J. Phys. Chem. Solids34, 1693 (1973)

    Article  Google Scholar 

  24. L.C.Kimerling, D.V.Lang: Inst. Phys. Conf. Ser.23, 589 (1975)

    Google Scholar 

  25. W.Frank, U.Gösele, A.Seeger: Proc. Intern. Conf. on Radiation Physics of Semiconductors and Related Materials (Tbilisi 1979). in press

  26. T.Ishida, K.Maeda, S.Takeuchi: Appl. Phys.21, 257 (1980)

    Article  ADS  Google Scholar 

  27. A.Seeger: Philos. Mag.46, 1194 (1955)

    Google Scholar 

  28. J.Nishizawa: J. Jpn. Assoc. Crystal Growth5, 211 (1978)

    Google Scholar 

  29. S.O'Hara, P.W.Hutchinson, P.S.Dobson: Appl. Phys. Lett30, 368 (1977)

    Article  ADS  Google Scholar 

  30. T.Suzuki, M.Ogawa: Appl. Phys. Lett.31, 473 (1977)

    Article  ADS  Google Scholar 

  31. T.Kajimura: J. Appl. Phys.51, 908 (1980)

    Article  ADS  Google Scholar 

  32. C.Werkhoven, J.H.T.Hengst, C.van Opdorp: Appl. Phys. Lett.35, 136 (1979)

    Article  ADS  Google Scholar 

  33. G.A.Rozgonyi, M.A.Afromowitz: Appl. Phys. Lett.19, 153 (1971)

    Article  Google Scholar 

  34. W.T.Stacy, A.J.R.de Kock: Private communication

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Frank, W., Gösele, U. The influence of intrisic defects on the degradation and luminescence of GaAs and other III–V compounds. Appl. Phys. 23, 303–309 (1980). https://doi.org/10.1007/BF00914916

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