Abstract
The composition and the stability of chemically etched, mechanically polished and oxidized surfaces of single crystals of cadmium-telluride were studied by secondary ion mass spectroscopy (SIMS), Rutherford backscattering (RBS) and ellipsometry. CdTe surfaces etched using a solution of bromine in methanol were found to be enriched in cadmium but a film, identified to be an oxide of tellurium, was observed to grow on it at room temperature and in air. The thickness of this film increased over long periods of timet linearly versus lnt. Mechanically polished samples and also chemically etched surfaces which were oxidized in a solution of hydrogen peroxide in amoniac were found to be stable.
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Hage-Ali, M., Stuck, R., Saxena, A. et al. Studies of CdTe surfaces with secondary ion mass spectrometry, rutherford backscattering and ellipsometry. Appl. Phys. 19, 25–33 (1979). https://doi.org/10.1007/BF00900533
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DOI: https://doi.org/10.1007/BF00900533