Abstract
Nitrogen ions were implanted in GaAs1−xPx (x=0.4; 0.65) at room temperature at various doses from 5×1012 cm−2 to 5×1015 cm−2 and annealed at temperatures from 600°C up to 950°C using a sputtered SiO2 encapsulation to investigate the possibility of creating isoelectronic traps by ion implantation. Photoluminescence and channeling measurements were performed to characterize implanted layers. The effects of damage induced by optically inactive neon ion implantation on photoluminescence spectrum were also investigated. By channeling measurements it was found that damage induced by nitrogen implantation is removed by annealing at 800°C. A nitrogen induced emission intensity comparable to the intensity of band gap emission for unimplanted material was observed for implanted GaAs0.6P0.4 after annealing at 850°C, while an enhancement of the emission intensity by a factor of 180 as compared with an unimplanted material was observed for implanted GaAs0.35P0.65 after annealing at 950°C. An anomalous diffusion of nitrogen atoms was found for implanted GaAs0.6P0.4 after annealing at and above 900°C.
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