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Study of the frequency characteristics of the electrolyte-semiconductor interface

  • Physical Chemistry
  • Published:
Bulletin of the Academy of Sciences of the USSR, Division of chemical science Aims and scope

Conclusions

  1. 1.

    A general expression was obtained for the impedance of the electrolyte-semiconductor contact in the presence of surface levels. The volume properties of the semiconductor also prove substantial.

  2. 2.

    Assuming the thickness of the Helmholtz layer equal to zero, we can obtain the impedance of the semiconductor considering the influence of the field effect.

  3. 3.

    A number of limiting cases covering various frequency and potential ranges were considered; the frequency characteristics of the contact were found in the absence of surface levels.

  4. 4.

    The condition was formulated, upon violation of which the capacitance of the semiconductor and Helmholtz layer of the electrolyte cannot be considered as connected in series.

  5. 5.

    Data can be obtained on the surface levels on a semiconductor, as well as data on the volume properties of the semiconductor, from an experimental study of the frequency characteristics of the electrolyte-semiconductor contact.

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Literature cited

  1. K. Bohnenkamp and H. J. Engell, Z. Electrochem.61, 1184 (1957).

    Google Scholar 

  2. H. Gobrecht, O. Meinhardt, and M. Lerche, Ber. Bunsenges67, 487 (1963).

    Google Scholar 

  3. R. M. Hurd and P. T. Wrotenbery, Ann. N. Y. Acad. Sci.101, 876 (1963).

    Google Scholar 

  4. V. A. Myamlin and B. M. Grafov, Izv. AN SSSR. Otd. Khim. N., 1012 (1963).

  5. F. Berz, J. Phys. Chem. Sol.23, 1795 (1962).

    Google Scholar 

  6. Collection: Surface Physics of Semiconductors [Russian Translation], Editor G. E. Pikus. Izd-vo Inostr. Lit., Moscow., (1959).

  7. Smith. Semiconductors [Russian Translation], Izd-vo Inostr. Lit., Moscow (1962).

  8. F. Berz. J. Electronics and Control6, 197 (1959).

    Google Scholar 

  9. W. Shockly and W. T. Read, Phys. Rev.87, 835 (1952).

    Google Scholar 

  10. R. S. Nakhmanson, Fiz. Tverdogo Tela,6, 115 (1964).

    Google Scholar 

  11. K. Lehoves and A. Slobodskii, Solid-State Electronics7, 59 (1964).

    Google Scholar 

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Author information

Authors and Affiliations

  1. Institute of Electrochemistry, Academy of Sciences, USSR

    Yu. Ya. Gurevich & V. A. Myamlin

Authors
  1. Yu. Ya. Gurevich
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  2. V. A. Myamlin
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Additional information

The article is published on the basis of the resolution of the Conference of Editors-in-Chief of the Journals of the Academy of Sciences, USSR, from July 12, 1962 as the dissertation work of Yu. Ya. Gurevich.

In conclusion, the authors would like to express their profound gratitude to V. G. Levich and Yu. V. Pleskov for their useful discussion.

Translated from Izvestiya Akademii Nauk SSSR, Seria Khimicheskaya, No. 10, pp. 1776–1785, October, 1964

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Gurevich, Y.Y., Myamlin, V.A. Study of the frequency characteristics of the electrolyte-semiconductor interface. Russ Chem Bull 13, 1685–1693 (1964). https://doi.org/10.1007/BF00849429

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  • DOI: https://doi.org/10.1007/BF00849429

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