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Kinetics of some oxidation-reduction reactions in the system metal-semiconductor film-electrolyte solution

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Bulletin of the Academy of Sciences of the USSR, Division of chemical science Aims and scope

Conclusions

  1. 1.

    The general expressions for the polarization characteristics of the metal — semiconductor film — electrolyte solution system formally remain the same as for the semiconductor —solution system.

  2. 2.

    The transport coefficients coincide in order of magnitude with the corresponding values for an infinite semiconductor. The transport coefficients depend on the film thickness.

  3. 3.

    The exchange currents depend on the work function of the isolated metal and the isolated semiconductor, as well as on the film thickness.

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Literature cited

  1. I. L. Rozenfel'd and E. K. Oshe, Dokl. AN SSSR,125, 139 (1959). E. K. Oshe and I. L. Rozenfel'd. Transactions of the Second All-Union Conference on Radiation Chemistry [in Russian] 1962; F. F. Vol'kenshtein, V. S. Kuznetsov, and V. B. Sandomirskii, Kinetika i Kataliz,3, 712 (1962); J. N. Butter, J. Chem. Phys.35, No. 2 (1961).

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The article is published on the basis of the resolution of the Conference of Editors-in-Chief of the Journals of the Academy of Sciences, USSR, on July 12, 1962, as the dissertation work of A. M. Kuznetsov.

Translated from Izvestiya Akademii Nauk SSSR, Seriya Khimicheskaya, No. 12 p. 2140–2145, December, 1964

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Kuznetsov, A.M., Dogonadze, R.R. Kinetics of some oxidation-reduction reactions in the system metal-semiconductor film-electrolyte solution. Russ Chem Bull 13, 2042–2046 (1964). https://doi.org/10.1007/BF00844211

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  • DOI: https://doi.org/10.1007/BF00844211

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