Abstract
Cast iron containing spheroidal graphite is tested for microinhomogeneity in silicon. The laser light is passed via a lens and transparent film, the latter collecting the products from the pulse, which are then subjected to standard arc analysis.
Similar content being viewed by others
References
J. T. McCormack, Metals Review, no. 3, 6, 1965.
Jarrell-Ash, Laser Microprobe Bulletin, 45–100, May, 1963.
A. A. Zhukov, A. N. Kokora, V. A. Shalashov, L. P. Lisovskii, and A. A. Chel'nyi, Vestnik mashinostroeniya, no. 10, 54, 1966.
A. A. Zhukov, Liteinoe Proizvodstvo, no, 11, 28, 1965.
M. A. Kvishtal, E. P. Rikman, and A. A. Zhukov, Liteinoe Proizvodstvo, no. 2, 28, 1960.
Additional information
We are indebted to L. N. Kaporskii for valuable discussions.
Rights and permissions
About this article
Cite this article
Zhukov, A.A., Nikiforova, E.F. & Kokora, A.N. Localized spectral analysis by laser. J Appl Spectrosc 6, 388–389 (1967). https://doi.org/10.1007/BF00707507
Issue Date:
DOI: https://doi.org/10.1007/BF00707507