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Improved inverse WKB procedure to reconstruct refractive index profiles of dielectric planar waveguides

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Abstract

A new method to reconstruct smooth refractive-index profiles from measured effective indices is presented. The profile form near the surface and its approach towards the bulk value are explicitely taken into account. Well behaved profiles such as Gaussian or exponential can be reconstructed within experimental accuracy from three modes only, and even two modes may provide useful information. The method is tested for numerical stability.

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Authors and Affiliations

  1. Fachbereich Physik, Universität, Barbarastrasse 7, D-4500, Osnabrück, Fed. Rep. Germany

    P. Hertel & H. P. Menzler

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  1. P. Hertel
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  2. H. P. Menzler
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Hertel, P., Menzler, H.P. Improved inverse WKB procedure to reconstruct refractive index profiles of dielectric planar waveguides. Appl. Phys. B 44, 75–80 (1987). https://doi.org/10.1007/BF00694196

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  • DOI: https://doi.org/10.1007/BF00694196

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