Abstract
In low-energy electron microscopy (LEEM) surfaces are imaged with LEED electrons. The physical and electron-optical principles of the method are described as well as a prototype LEEM microscope. Micrographs of Mo, Si, and Au surfaces illustrate the various types of contrast obtained with LEEM and its application.
Similar content being viewed by others
References
H.-J. Herlt, R. Feder, G. Meister, E.G. Bauer: Solid State Commun.38, 973 (1981)
N. Osakabe, Y. Tanishiro, K. Yagi, G. Honjo: Surf. Sci.97, 393 (1980)
E. Bauer: InElectron Microscopy, ed. by S.S. Breese, Jr. (Academic, New York 1962) Vol. 1, D-11
R.A. Schwarzer: Microscopica acta84, 51 (1981)
A. Recknagel: Z. Physik117, 689 (1941)
E. Bauer: Ultramicroscopy17, 51 (1985)
G. Bartz: Proc. 4. Internat. Kongr. Elektronenmikrosk., Berlin (1958) Vol. 1, 201–207
W. Telieps, E. Bauer: Ultramicroscopy17, 57 (1985)
W. Telieps, E. Bauer: Surf. Sci.162, 163 (1985)
W. Telieps, E. Bauer: Ber. Bunsenges. Phys. Chem.90, 197 (1986)
M. Henzler, J. Clabes: Jpn. J. Appl. Phys. Suppl.2, Pt. 2, 389 (1974)
T. Sakamoto, T. Kawamura, G. Hashiguchi: Appl. Phys. Lett.48, 1612 (1986)
D.E. Aspnes, J. Ihm: Phys. Rev. Lett.57, 3054 (1986)
H. Krömer: Proc. 1986 Spring Meet. Mat. Res. Soc. (in press)
K. Müller: Ber. Bunsenges. Phys. Chem.90, 184 (1986)
P.J. Estrup: InChemistry and Physics of Solid Surfaces V, ed. by R. Vanselow and R. Howe, Springer Ser. Chem. Phys.35 (Springer, Berlin, Heidelberg 1984) pp. 205–230