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Preparation and imaging of macro-bicrystals in thin films

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Abstract

A recently proposed technique for preparing, in a very simple way, thin film tilt grain boundaries is described and analyzed. Some electron microscopy characterization of the bicrystals is presented and a comparison between this new method and some of the standard techniques is made from a critical point of view. Some new applications of grain boundary research using this technique are also proposed.

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Authors and Affiliations

  1. Instituto de Fisica, U.N.A.M., Apartado Postal 20-364, 01000, Mexico, D.F., Mexico

    I. H. Arita, R. Hernández & V. M. Castaño

Authors
  1. I. H. Arita
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  2. R. Hernández
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  3. V. M. Castaño
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Arita, I.H., Hernández, R. & Castaño, V.M. Preparation and imaging of macro-bicrystals in thin films. Appl. Phys. A 47, 413–417 (1988). https://doi.org/10.1007/BF00615507

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  • DOI: https://doi.org/10.1007/BF00615507

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