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Hot-electron drift velocity in III–V semiconductors under the condition of impact ionization

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Abstract

A calculation has been carried out for the drift velocity of electrons in the highfield region under the condition of impact ionization in III–V semiconductor compounds.

The energy-balance equation of the one-electron model has been solved considering alloy scattering and carrier-carrier interaction, in addition to optical phonon and ionization scattering. Fairly good agreement is obtained for GaAs with the available experimental and Monte-Carlo results. Graphs for the high-field drift velocity has also been plotted for Ga1−x InxAs (x = 0.53) at different ratios of ionization mean-free path and optical phonon mean-free path. The plot of high-field drift velocity versus ionization rate reveals that the high-field drift velocity strongly depends on the ionization rate of carriers, and vice versa.

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Singh, S.R., Pal, B.B. Hot-electron drift velocity in III–V semiconductors under the condition of impact ionization. Appl. Phys. A 43, 53–60 (1987). https://doi.org/10.1007/BF00615206

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