Skip to main content

Effect of Energy Loss Due to \(1s \to 2p\) Excitation and Ionization of Neutral Impurities on the Non-Ohmic Characteristics of a Compound Semiconductor at Low Lattice Temperature

  • Conference paper
  • First Online:
Computers and Devices for Communication (CODEC 2019)

Part of the book series: Lecture Notes in Networks and Systems ((LNNS,volume 147))

Included in the following conference series:

  • 587 Accesses

Abstract

At low lattice temperatures \(\left( {T_{{\text{L}}} \le 20\,K} \right)\), an apparently low electric field may effectively serve as high enough to significantly perturb an electron ensemble in a semiconductor from the state of thermodynamic equilibrium with the lattice atoms. The energy loss rate by an electron of the ensemble through impact ionization and excitation of neutral impurities may turn out to be comparable with the loss rate through interactions with the prevalent phonons and this takes part in controlling the non-Ohmic characteristics of the material. The present analysis deals with the calculation of the net energy loss rate of an electron and the subsequent effective electron temperature characteristics. The results obtained for InSb are compared with other theoretical and available experimental data. The agreement with the experiments is quite satisfactory. Moreover, the effects of impact ionization and neutral impurities at low temperatures are indeed not always negligible.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 189.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 249.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Conwell, E.M.: High Field Transport in Semiconductors. Academic Press, New York (1967)

    Google Scholar 

  2. Nag, B.R.: Electron Transport in Compound Semiconductor. Springer, Berlin Heidelberg (1980)

    Book  Google Scholar 

  3. Canali, C., Jacoboni, C., Nava, F., Ottaviani, G., Alberigi-Quaranta, A.: Electron drift velocity in silicon. Phys. Rev. B. 12, 2265–2284 (1975)

    Article  Google Scholar 

  4. Bhattacharya, D.P., Pramanik, T.K.: Effect of finite energy of deformation-potential acoustic phonons on the temperature of non-equilibrium carriers. J. Phys. Chem. Sol. 52, 735–744 (1991)

    Article  Google Scholar 

  5. Kachlishvili, Z.S.: Inelastic impurity scattering of hot electrons in semiconductors. Phys. Stat. Sol. 48, 65 (1971)

    Google Scholar 

  6. Bauer, G.: Springer Tracts in Modern Physics, vol. 74. Springer, New York (1974)

    Google Scholar 

  7. Bonch-Bruevich, V.L., Landsberg, E.G.: Recombination mechanisms. Phys. Stat. Sol. 29(1), 9–43 (1968)

    Article  Google Scholar 

  8. Kittel, C.: Introduction to Solid State Physics. Wiley, India (2013)

    MATH  Google Scholar 

  9. Zylbersztejn, A.: Theory of low-temperature impact ionization in the high-purity germanium. Phys. Rev. 127(3), 744 (1962)

    Article  Google Scholar 

Download references

Acknowledgements

S. Saha is indebted to Higher Education, Science and Technology and Biotechnology Department, Government of West Bengal, India for providing Swami Vivekananda Merit Cum Means Scholarship Scheme. The authors also acknowledge the help rendered by B. Roy.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Debi Prosad Bhattacharya .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2021 Springer Nature Singapore Pte Ltd.

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Saha, S., Mukhopadhyay, S., Bhattacharya, D.P. (2021). Effect of Energy Loss Due to \(1s \to 2p\) Excitation and Ionization of Neutral Impurities on the Non-Ohmic Characteristics of a Compound Semiconductor at Low Lattice Temperature. In: Das, N.R., Sarkar, S. (eds) Computers and Devices for Communication. CODEC 2019. Lecture Notes in Networks and Systems, vol 147. Springer, Singapore. https://doi.org/10.1007/978-981-15-8366-7_57

Download citation

  • DOI: https://doi.org/10.1007/978-981-15-8366-7_57

  • Published:

  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-15-8365-0

  • Online ISBN: 978-981-15-8366-7

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics