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Analysis of x-ray diffraction patterns for crystals subjected to certain kinds of external fields

  • Solid State Physics
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Russian Physics Journal Aims and scope

Abstract

We derive the dependence of the x-ray structure factor of a crystal on the characteristics of an external force field acting on the sample. Relations are obtained which enable a detailed analysis of the positions, heights, and peak shapes in the resulting diffraction patterns. Specific examples are presented of the diffraction patterns formed in the presence of certain types of external fields.

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Authors
  1. E. N. Treushnikov
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Additional information

S. Ordzhonikidza State Geologic Exploration Institute, Moscow. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 5, pp. 3–7, May, 1995.

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Treushnikov, E.N. Analysis of x-ray diffraction patterns for crystals subjected to certain kinds of external fields. Russ Phys J 38, 439–442 (1995). https://doi.org/10.1007/BF00559295

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  • DOI: https://doi.org/10.1007/BF00559295

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