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Bridgman grown Hg1−x Cd x Te: crystalline quality assessment by X-ray topography

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Abstract

Different growth speeds and thermal annealings were applied to Bridgman grown crystals. Several characterization methods (X-ray topography, energy dispersive atomic spectroscopy (EDAX) etc.) showed that the most suitable conditions are a high growing speed and a thermal treatment of no less than 30 days.

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Authors and Affiliations

  1. Comision Nacional de Investigaciones Cientificas y Tecnicas, CITEFA-DINSO, Zufriategui 4380, 1603, Villa Martelli, Provincia de Buenos Aires, Argentina

    A. B. Trigubo

  2. Comision Nacional de Investigaciones Espaciales, CITEFA-DINSO, Zufriategui 4380, 1603, Villa Martelli, Provincia de Buenos Aires, Argentina

    I. Nollmann

  3. Instituto de Investigaciones Cientificas y Tecnicas de las Fuerzas Armadas, CITEFA-DINSO, Zufriategui 4380, 1603, Villa Martelli, Provincia de Buenos Aires, Argentina

    J. R. Casanova

Authors
  1. A. B. Trigubo
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  2. I. Nollmann
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  3. J. R. Casanova
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Trigubo, A.B., Nollmann, I. & Casanova, J.R. Bridgman grown Hg1−x Cd x Te: crystalline quality assessment by X-ray topography. J Mater Sci 27, 641–645 (1992). https://doi.org/10.1007/BF00554029

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  • DOI: https://doi.org/10.1007/BF00554029

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