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Transport properties of vacuum deposited tin-tellurium alloy films

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Abstract

The transport properties of Sn1−xTex (0<x<1) alloy films (200 nm) deposited on a glass substrate at room temperature have been studied. It has been observed that films with composition around x=0.6 show minimum resistivity, maximum carrier mobility and more order in their structure. The ordered films are found to have a higher value of temperature coefficient of resistivity than the disordered ones.

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Authors and Affiliations

  1. Solid State Research Laboratory, Department of Physics, Guru Nanak Dev University, 143005, Amritsar, India

    I. S. Athwal, Meenakshi Thaman & R. K. Bedi

Authors
  1. I. S. Athwal
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  2. Meenakshi Thaman
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  3. R. K. Bedi
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Athwal, I.S., Thaman, M. & Bedi, R.K. Transport properties of vacuum deposited tin-tellurium alloy films. J Mater Sci 21, 3243–3247 (1986). https://doi.org/10.1007/BF00553363

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  • DOI: https://doi.org/10.1007/BF00553363

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