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X-ray analysis of microscopic structure in deformed brass

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Abstract

The microscopic structure of brass is systematically studied by X-ray diffraction profile analysis in this paper. The samples were heat treated differently and deformed in an unidirectional tensile state. Parameters such as the effective grain size, average dislocation density, dislocation configuration parameter and stored deformation energy density are carefully deduced from X-ray diffraction data based on some recent theories and models. These parameters change with macroscopic stress and strain regularly and it is possible to establish a quantitative relationship between the microscopic structure and macroscopic properties. There is an unique relationship between the structure parameters and stress rather than strain for different sample heat treatments.

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Authors and Affiliations

  1. Physics Department, Jilin University, 130023, Changchun, China

    F. Tung, S. Zwui & Y. Wang

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  1. F. Tung
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  2. S. Zwui
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  3. Y. Wang
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Tung, F., Zwui, S. & Wang, Y. X-ray analysis of microscopic structure in deformed brass. J Mater Sci 21, 3223–3226 (1986). https://doi.org/10.1007/BF00553359

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  • DOI: https://doi.org/10.1007/BF00553359

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