Abstract
A transient negative photoconductivity phenomenon observed in silicon doped with gold atoms has been investigated. On the basis of the trapping of photo-excited carriers into two deep levels of gold atoms, a model for the occurrence of transient negative photoconductivity is proposed and related qualitatively to some experimental results.
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Kimura, H., Kurosu, T., Akiba, Y. et al. A model for the occurrence of transient negative photoconductivity in silicon doped with gold. Appl. Phys. A 53, 194–197 (1991). https://doi.org/10.1007/BF00324250
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DOI: https://doi.org/10.1007/BF00324250