Summary
Radiation sensitive mutants of Saccharomyces cerevisiae were exposed to the action of nitrogen mustard (HN2) and methyl methanesulfonate (MMS). Sensitivity to HN2 was found to be correlated with sensitivity to ultraviolet light, whereas sensitivity to MMS was found to be correlated with sensitivity to X-rays. One mutant strain that is sensitive to both UV and X-rays was found to be sensitive also to HN2 and MMS. The latter result shows that there exists a locus in yeast that controls the repair of DNA damaged by all four of these mutagens.
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Communicated by E. M. Witkin
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Brendel, M., Khan, N.A. & Haynes, R.H. Common steps in the repair of alkylation and radiation damage in yeast. Molec. Gen. Genetics 106, 289–295 (1970). https://doi.org/10.1007/BF00324046
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DOI: https://doi.org/10.1007/BF00324046