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Nano Research

, Volume 11, Issue 5, pp 2809–2820 | Cite as

In situ atomic-scale observation of monolayer graphene growth from SiC

  • Kaihao Yu
  • Wen Zhao
  • Xing Wu
  • Jianing Zhuang
  • Xiaohui Hu
  • Qiubo Zhang
  • Jun Sun
  • Tao Xu
  • Yang Chai
  • Feng Ding
  • Litao Sun
Research Article

Abstract

Because of its high compatibility with conventional microfabrication processing technology, epitaxial graphene (EG) grown on SiC shows exceptional promise for graphene-based electronics. However, to date, a detailed understanding of the transformation from three-layer SiC to monolayer graphene is still lacking. Here, we demonstrate the direct atomic-scale observation of EG growth on a SiC (11̅00) surface at 1,000 °C by in situ transmission electron microscopy in combination with ab initio molecular dynamics (AIMD) simulations. Our detailed analysis of the growth dynamics of monolayer graphene reveals that three SiC (11̅00) layers decompose successively to form one graphene layer. Sublimation of the first layer causes the formation of carbon clusters containing short chains and hexagonal rings, which can be considered as the nuclei for graphene growth. Decomposition of the second layer results in the appearance of new chains connecting to the as-formed clusters and the formation of a network with large pores. Finally, the carbon atoms released from the third layer lead to the disappearance of the chains and large pores in the network, resulting in a whole graphene layer. Our study presents a clear picture of the epitaxial growth of the monolayer graphene from SiC and provides valuable information forfuture developments in SiC-derived EG technology.

Keywords

graphene epitaxial growth in situ transmission electron microscopy 

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Notes

Acknowledgements

This work was supported by the National Natural Science Foundation of China (Nos. 51420105003, 11525415, 11327901, 61274114, 11674052, and 11604047) and the Fundamental Research Funds for the Central Universities (Nos. 2242016K41039, MTEC-2015M03, and NJ20150026) and the Natural Science Foundation of Jiangsu Province (No. BK20160694). W. Z. and F. D. acknowledge the support of Institute for Basic Science, Republic of Korea (No. IBS-R019-D1). X. W. would like to acknowledge support from the Projects of Science and Technology Commission of Shanghai Municipality (No. 14DZ2260800).

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In situ atomic-scale observation of monolayer graphene growth from SiC

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Copyright information

© Tsinghua University Press and Springer-Verlag GmbH Germany, part of Springer Nature 2017

Authors and Affiliations

  • Kaihao Yu
    • 1
  • Wen Zhao
    • 2
    • 4
  • Xing Wu
    • 1
    • 5
  • Jianing Zhuang
    • 4
  • Xiaohui Hu
    • 1
    • 6
  • Qiubo Zhang
    • 1
  • Jun Sun
    • 1
  • Tao Xu
    • 1
  • Yang Chai
    • 9
  • Feng Ding
    • 2
    • 3
    • 4
  • Litao Sun
    • 1
    • 7
    • 8
  1. 1.SEU-FEI Nano-Pico Center, Key Laboratory of MEMS of Ministry of Education, School of Electronic Science and EngineeringSoutheast UniversityNanjingChina
  2. 2.Center for Multidimensional Carbon MaterialsInstitute for Basic ScienceUlsanRepublic of Korea
  3. 3.School of Materials Science and EngineeringUlsan National Institute of Science and TechnologyUlsanRepublic of Korea
  4. 4.Institute of Textiles and ClothingHong Kong Polytechnic UniversityHong KongChina
  5. 5.Shanghai Key Laboratory of Multidimensional Information Processing, Department of Electrical EngineeringEast China Normal UniversityShanghaiChina
  6. 6.College of Materials Science and EngineeringNanjing Tech UniversityNanjingChina
  7. 7.Center for Advanced Carbon MaterialsSoutheast University and Jiangnan Graphene Research InstituteChangzhouChina
  8. 8.Center for Advanced Materials and ManufactureJoint Research Institute of Southeast University and Monash UniversitySuzhouChina
  9. 9.Department of Applied PhysicsThe Hong Kong Polytechnic UniversityHong KongChina

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