Abstract
In this work, hydrogenated gallium-doped zinc oxide (HGZO) thin films were deposited on polyethylene terephthalate substrates at room temperature by RF magnetron sputtering. The effects of RF power and Ar + H2 flow rate on electrical and optical properties of HGZO thin films were investigated systematically. All of HGZO thin films exhibited a high average transmittance of about 77.3–82.9% in the visible range, and the minimum resistivity value reached 7.1 × 10− 4 Ω·cm. Potential application of polymer-dispersed liquid crystal device based on HGZO thin film was also successfully demonstrated.
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This work was supported by National Natural Science Foundation of China (61774160).
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Zhu, C., Zhou, T., Shi, F. et al. Room-temperature RF magnetron sputtering deposition of hydrogenated Ga-doped ZnO thin films on PET substrates for PDLC devices. Appl. Phys. A 124, 850 (2018). https://doi.org/10.1007/s00339-018-2276-z
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DOI: https://doi.org/10.1007/s00339-018-2276-z