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Effect of temperature and grain size on the stability of the microstructure of Ag films during annealing

  • Proceedings of the VI International Conference “Crystal Physics and the Deformation Behavior of Promising Materials”
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Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

Grain growth in thin silver films is investigated experimentally. It is shown that the duration of the incubation period preceding linear or parabolic grain growth depends on the annealing temperature and average grain size. It is found that the lower the isothermal annealing temperature and the smaller the grain size, the longer the period of incubation, i.e., the longer the period of microstructure stability.

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References

  1. Estrin, Y., Gottstein, G., Rabkin, E., and Shvindlerman, L.S., Acta Mater., 2001, vol. 49, p. 673.

    Article  Google Scholar 

  2. Sursaeva, V.G., Bull. Russ. Acad. Sci.: Phys., 2015, vol. 79, no. 9, p. 1130.

    Article  Google Scholar 

  3. Sursaeva, V.G., Protasova, S.G., and Tuflin, A.Yu., Poverkhnost, 1999, no. 2, p. 51.

    Google Scholar 

  4. Sursaeva, V., Mater. Res. Soc. Symp. Proc., 1994, vol. 343, p. 71.

    Article  Google Scholar 

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Correspondence to V. G. Sursaeva.

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Original Russian Text © V.G. Sursaeva, 2016, published in Izvestiya Rossiiskoi Akademii Nauk, Seriya Fizicheskaya, 2016, Vol. 80, No. 10, pp. 1445–1447.

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Sursaeva, V.G. Effect of temperature and grain size on the stability of the microstructure of Ag films during annealing. Bull. Russ. Acad. Sci. Phys. 80, 1287–1289 (2016). https://doi.org/10.3103/S1062873816100191

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  • DOI: https://doi.org/10.3103/S1062873816100191

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