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Lattice deformation in thin BiFeO3 and Ba0.8Sr0.2TiO3 epitaxial films on (001)MgO single crystalline substrates

  • Proceedings of the International Symposium “Environments with Structural and Magnetic Ordering” Multiferroics 4
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Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

Bi0.98Nd0.02FeO3 (BNFO) and Ba0.8Sr0.2TiO3 (BST) epitaxial films produced by rf cathode sputtering on (001)MgO substrates are studied by means of XRD. The thickness dependences of uniform lattice deformations and linear dislocation density, generated due to epitaxial stress relaxation, are plotted.

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Authors and Affiliations

  1. Research Institute of Physics, Southern Federal University, Rostov-on-Don, 344090, Russia

    O. A. Bunina & D. V. Stryukov

  2. Southern Federal Univesity, Rostov-on-Don, 344090, Russia

    O. A. Bunina & D. V. Stryukov

  3. Southern Scientific Center, Russian Academy of Sciences, Rostov-on-Don, 34406, Russia

    Yu. I. Golovko & V. M. Muchortov

Authors
  1. O. A. Bunina
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  2. D. V. Stryukov
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  3. Yu. I. Golovko
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  4. V. M. Muchortov
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Corresponding author

Correspondence to O. A. Bunina.

Additional information

Original Russian Text © O.A. Bunina, D.V. Stryukov, Yu.I. Golovko, V.M. Muchortov, 2014, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2014, Vol. 78, No. 8, pp. 998–1001.

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Bunina, O.A., Stryukov, D.V., Golovko, Y.I. et al. Lattice deformation in thin BiFeO3 and Ba0.8Sr0.2TiO3 epitaxial films on (001)MgO single crystalline substrates. Bull. Russ. Acad. Sci. Phys. 78, 769–772 (2014). https://doi.org/10.3103/S1062873814080103

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  • DOI: https://doi.org/10.3103/S1062873814080103

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