Skip to main content
SpringerLink
Log in

The Coupled Wave Thickness Method as a Universal Method for Synthesizing Interference Antireflection Coatings (\({\pi}\)-Structures)

  • Published:
Moscow University Physics Bulletin Aims and scope

Abstract

A method is proposed and a universal algorithm is constructed on its basis. The algorithm includes a complete set of all structural solutions encountered in the synthesis of antireflection multilayer structures. Exact analytical relations are obtained that make it possible to synthesize antireflection structures with the minimum possible number of layers for any real values of the refractive indices of both matched media and materials of layers of such structures. Their structural and matching properties are analyzed and generalized. The correctness of the obtained exact solutions and the efficiency of the method are confirmed by a numerical experiment.

Keywords: multilayer structures, interference

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1

Similar content being viewed by others

REFERENCES

  1. A. H. MacLeod, Thin-Film Optical Filters, 4th ed. (CRC, Boca Raton, FL, 2010).

    Book  Google Scholar 

  2. P. Kard, Analysis and Synthesis of Multilayer Interference Coatings (Valgus, Tallin, 1971) [in Russian].

    Google Scholar 

  3. T. V. Rozenberg, Optics of Thin-Layer Coatings (Nauka, Moscow, 1958) [in Russian].

    Google Scholar 

  4. M. Born and E. Wolf, Principles of Optics (Pergamon, Oxford, 1964).

    MATH  Google Scholar 

  5. L. V. Brekhovskikh, Waves in Layered Media (Nauka, Moscow, 1973; Academic, New York, 1980).

  6. G. Hass, M. Francombe, and R. Hoffman, Physics of Thin Films (Academic, San Francisco, London, 1975).

    Google Scholar 

  7. V. B. Glasko, A. N. Tikhonov, and A. V. Tikhonravov, Zh. Vychisl. Mat. Mat. Fiz. 14, 135 (1974).

    Google Scholar 

  8. A. V. Tikhonravov, V. G. Zhupanov, V. N. Fedoseev, and M. K. Trubetskov, Opt. Express 22, 32174 (2014).

    Article  ADS  Google Scholar 

  9. Zh. O. Dombrovskaya, Model. Anal. Inform. Sist. 23 (C5), 539 (2016).

    Article  MathSciNet  Google Scholar 

  10. A. V. Tikhonravov and M. K. Trubetskov, Appl. Opt. 51, 7319 (2012). doi 1364/AO.51.007319.

  11. A. Tikhonravov, M. Trubetskov, and T. Amotchkina, Optical Thin Films and Coatings, Ed. by A. Piegari and F. Flory (Cambridge, 2013).

    Google Scholar 

  12. A. V. Kozar’, Opt. Spectrosc. 59, 678 (1985).

    ADS  Google Scholar 

  13. A. V. Kozar’, Opt. Spectrosc. 64, 672 (1988).

    ADS  Google Scholar 

  14. A. V. Kozar’ and A. V. Kozlov, Vestn. Mosk. Univ., Fiz. Astron. 30 (3), 43 (1989).

    Google Scholar 

  15. A. V. Kozar’ and E. L. Ryazanova, Vestn. Mosk. Univ., Fiz. Astron. 31 (5), 52 (1990).

    Google Scholar 

  16. A. V. Kozar’ and E. V. Putrina, Vestn. Mosk. Univ., Fiz. Astron. 33 (5), 31 (1992).

    Google Scholar 

  17. A. V. Kozar’ and E. V. Putrina, Vestn. Mosk. Univ., Fiz. Astron. 33 (6), 57 (1992).

    Google Scholar 

  18. A. V. Kozar’, E. V. Putrina, and O. V. Fionova, Vestn. Mosk. Univ., Fiz. Astron. 36 (3), 39 (1995).

    Google Scholar 

  19. A. V. Kozar’, Preprint No 8/2003 (Phys. Dep., Mosc. State Univ., Moscow, 2003), pp. 1–10.

  20. A. V. Kozar, Mosc. Univ. Phys. Bull. 64, 291 (2009). https://doi.org/10.3103/S0027134909030138

    Article  ADS  Google Scholar 

  21. A. V. Kozar, Mosc. Univ. Phys. Bull. 73, 638 (2018). https://doi.org/10.3103/S0027134918060164

    Article  ADS  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Department of Physics, Moscow State University, 119991, Moscow, Russia

    A. V. Kozar

Authors
  1. A. V. Kozar
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to A. V. Kozar.

Additional information

Translated by O. Pismenov

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Kozar, A.V. The Coupled Wave Thickness Method as a Universal Method for Synthesizing Interference Antireflection Coatings (\({\pi}\)-Structures). Moscow Univ. Phys. 75, 623–630 (2020). https://doi.org/10.3103/S0027134920060119

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.3103/S0027134920060119

Search

Navigation