Abstract
A model of a Schottky barrier is proposed in which dimers consisting of semiconductor defects and nearest metal atoms are present at the interface. Short-range Coulomb repulsion is included between defect electrons and metal atom electrons. Analytical expressions for the occupation numbers of atoms and defects and the Schottky barrier height are obtained.
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Translated by A. Sin’kov
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Davydov, S.Y., Posrednik, O.V. The Role of Coulomb Interaction in the Defect Model of a Schottky Barrier. Tech. Phys. Lett. 47, 234–236 (2021). https://doi.org/10.1134/S1063785021030081
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DOI: https://doi.org/10.1134/S1063785021030081