Abstract
Steady state leakage currents have been investigated in capacitor structures with ferroelectric solgel films of lead zirconate titanate (PZT) formed on silicon substrates with a lower Pt electrode. It is established that Pt/PZT/Hg structures, regardless of the PZT film thickness, are characterized by the presence of a rectifying contact similar to p–n junction. The steady state leakage current in the forward direction increases with a decrease in the film thickness and is determined by the ferroelectric bulk conductivity.
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Original Russian Text © Yu.V. Podgornyi, K.A. Vorotilov, A.S. Sigov, 2018, published in Fizika Tverdogo Tela, 2018, Vol. 60, No. 3, pp. 431–434.
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Podgornyi, Y.V., Vorotilov, K.A. & Sigov, A.S. Determination of the Steady State Leakage Current in Structures with Ferroelectric Ceramic Films. Phys. Solid State 60, 433–436 (2018). https://doi.org/10.1134/S1063783418030253
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DOI: https://doi.org/10.1134/S1063783418030253