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Comparative analysis of the thickness and electrical conductivity of thin chalcogenide semiconductor films

  • Surface Physics and Thin Films
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Abstract

The structure and thickness of zinc and cadmium chalcogenide semiconductor films are studied by X-ray radiography. The film thickness is shown to be comparable with the half-value layer depth. The electrical conductivity of the films increases upon heating in the hydrogen atmosphere and decreases upon heating in carbon oxide. The opposite trend is observed in the ratio between the electrical conductivity and band gap of the initial and oxidized film surfaces.

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Authors and Affiliations

  1. Omsk State Technical University, Omsk, 644033, Russia

    V. V. Dan’shina & L. F. Kalistratova

Authors
  1. V. V. Dan’shina
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  2. L. F. Kalistratova
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Correspondence to V. V. Dan’shina.

Additional information

Original Russian Text © V.V. Dan’shina, L.F. Kalistratova, 2017, published in Fizika Tverdogo Tela, 2017, Vol. 59, No. 1, pp. 172–175.

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Dan’shina, V.V., Kalistratova, L.F. Comparative analysis of the thickness and electrical conductivity of thin chalcogenide semiconductor films. Phys. Solid State 59, 180–183 (2017). https://doi.org/10.1134/S106378341701005X

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  • DOI: https://doi.org/10.1134/S106378341701005X

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