Abstract
The electronic properties of n-InP(100) surfaces passivated with various sulfide solutions are studied using photoluminescence and Raman spectroscopy. It is shown that the passivation process leads to an increase in the photoluminescence intensity of the semiconductor, which indicates a decrease in the velocity of nonradiative surface recombination accompanied by a narrowing of the surface space-charge region and an increase in the electron density in the analyzed semiconductor bulk. The efficiency of electronic passivation of the n-InP(100) surface depends on the composition of the sulfide solution.
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REFERENCES
J. A. del Alamo, Nature (London, U.K.) 479, 317 (2011).
M. Smit, K. Williams, and J. van der Tol, APL Photon. 4, 050901 (2019).
Q. Lin, D. Sarkar, Y. Lin, M. Yeung, L. Blankemeier, J. Hazra, W. Wang, S. Niu, J. Ravichandran, Z. Fan, and R. Kapadia, ACS Nano 11, 5113 (2017).
H. J. Joyce, J. Wong-Leung, C.-K. Yong, C. J. Docherty, S. Paiman, Q. Gao, H. H. Tan, C. Jagadish, J. Lloyd-Hughes, L. M. Herz, and M. B. Johnston, Nano Lett. 12, 5325 (2012).
X. Duan, Y. Huang, Y. Cui, J. Wang, and C. M. Lieber, Nature (London, U.K.) 409, 66 (2001).
F. Zafar and A. Iqbal, Proc. R. Soc. A 472, 20150804 (2016).
Z. Li, I. Yang, L. Li, Q. Gao, J. S. Chong, Z. Li, M. N. Lockrey, H. H. Tan, C. Jagadish, and L. Fu, Prog. Nat. Sci. Mater. 28, 178 (2018).
Z. Wu, P. Liu, W. Zhang, K. Wang, and X. W. Sun, ACS Energy Lett. 5, 1095 (2020).
N. Tajik, C. M. Haapamaki, and R. R. LaPierre, Nanotechnology 23, 315703 (2012).
C.-F. Yen and M.-K. Lee, J. Vac. Sci. Technol. B 30, 052201 (2012).
H.-K. Kang, Y.-S. Kang, M. Baik, K.-S. Jeong, D.-K. Kim, J.-D. Song, and M.-H. Cho, J. Phys. Chem. C 122, 7226 (2018).
D. H. van Dorp, L. Nyns, D. Cuypers, T. Ivanov, S. Brizzi, M. Tallarida, C. Fleischmann, P. Hönicke, M. Müller, O. Richard, D. Schmeißer, S. DeGendt, D. H. C. Lin, and C. Adelmann, ACS Appl. Electron. Mater. 1, 2190 (2019).
S. Tian, Z. Wei, Y. Li, H. Zhao, X. Fang, J. Tang, D. Fang, L. Sun, G. Liu, B. Yao, and X. Ma, Mater. Sci. Semicond. Process. 17, 33 (2014).
M. V. Lebedev, Yu. M. Serov, T. V. Lvova, R. Endo, T. Masuda, and I. V. Sedova, Appl. Surf. Sci. 533, 147484 (2020).
M. V. Lebedev, Yu. M. Serov, T. V. Lvova, I. V. Sedova, R. Endo, and T. Masuda, Semiconductors 54, 1843 (2020).
J. M. Moison, M. Van Rompay, and M. Bensoussan, Appl. Phys. Lett. 48, 1362 (1986).
G. Chen, S. B. Visbeck, D. C. Law, and R. F. Hicks, J. Appl. Phys. 91, 9362 (2002).
Y. Ishikawa, T. Fukui, and H. Hasegawa, J. Vac. Sci. Technol. B 15, 1163 (1997).
N. Newman, W. E. Spicer, T. Kendelewicz, and I. Lindau, J. Vac. Sci. Technol. B 4, 931 (1986).
J. R. Waldrop, S. P. Kowalczyk, and R. W. Grant, Appl. Phys. Lett. 42, 454 (1983).
M. V. Lebedev, Semiconductors 54, 699 (2020).
M. V. Lebedev, T. V. Lvova, A. L. Shakhmin, O. V. Rakhimova, P. A. Dementev, and I. V. Sedova, Semiconductors 53, 892 (2019).
P. Lautenschlager, M. Garriga, and M. Cardona, Phys. Rev. B 36, 4813 (1987).
L. Pavesi, F. Piazza, A. Rudra, J. F. Carlin, and M. Ilegems, Phys. Rev. B 44, 9052 (1991).
R. M. Sieg and S. A. Ringel, J. Appl. Phys. 80, 448 (1996).
L. Artús, R. Cuscó, J. Ibáñez, N. Blanco, and G. González-Díaz, Phys. Rev. B 60, 5456 (1999).
B. H. Bairamov, I. P. Ipatova, V. A. Milorava, V. V. Toporov, K. Naukkarinen, T. Tuomi, G. Irmer, and J. Monecke, Phys. Rev. B 38, 5722 (1988).
B. B. Boudart, B. Prévot, and C. Schwab, Appl. Surf. Sci. 50, 295 (1991).
A. Pinczuk, A. A. Ballman, R. E. Nahory, M. A. Pollack, and J. M. Worlock, J. Vac. Sci. Technol. 16, 1168 (1979).
L. A. Farrow, C. J. Sandroff, and M. C. Tamargo, Appl. Phys. Lett. 51, 1931 (1987).
D. E. Aspnes and A. A. Studna, Phys. Rev. B 27, 985 (1983).
V. N. Bessolov, M. V. Lebedev, N. M. Binh, M. Friedrich, and D. R. T. Zahn, Semicond. Sci. Technol. 13, 611 (1998).
E. V. Ivanova, P. A. Dementev, T. V. Lvova, and M. V. Lebedev, J. Phys.: Conf. Ser. 1697, 012061 (2020).
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This study was partially supported by the Russian Foundation for Basic Research, project no. 20-03-00523.
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Lebedev, M.V., Lvova, T.V., Smirnov, A.N. et al. Modification of the Electronic Properties of the n-InP (100) Surface with Sulfide Solutions. Semiconductors 55, 844–849 (2021). https://doi.org/10.1134/S1063782621100146
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DOI: https://doi.org/10.1134/S1063782621100146