Abstract
By optical methods (Raman spectroscopy, infrared spectroscopy, X-ray photoelectron spectroscopy) and electron-microscopy techniques, it was found that the atomic structure of germanium monoxide films of stoichiometric composition corresponds to the random bonding model and does not contain germanium nanoclusters. This structure is metastable and transforms into a random mixture structure at a temperature of 260°C and higher. The metastability of solid GeO can be caused by internal strains in the atomic network.
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ACKNOWLEDGMENTS
We thank A.G. Cherkov for conducting high-resolution TEM studies and I.P. Prosvirin for recording the XPS spectra of the GeO film.
The study was carried out in part with the use of equipment of the Collective Use Center “Nanostructures”, Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, and the Collective Use Center “High Technologies and Analytics of Nanosystems”, Novosibirsk State University.
Funding
The part of the study concerned with XPS measurements was supported by the Russian Science Foundation, project no. 18-49-08001. The part of the study concerned with Raman spectroscopy was supported by the Ministry of Education and Science of the Russian Federation, project no. 2020-1902-01-058.
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Translated by E. Smorgonskaya
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Astankova, K.N., Volodin, V.A. & Azarov, I.A. Structure of Germanium Monoxide Thin Films. Semiconductors 54, 1555–1560 (2020). https://doi.org/10.1134/S1063782620120027
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DOI: https://doi.org/10.1134/S1063782620120027