Abstract
Atomic force microscopy is a unique technique for probing the mechanical properties of nanostructures. Using the bending-based test method, one can measure the Young’s modulus of the material of a suspended object, a nanobridge. This article presents a new, improved version of the bending-based test method. A special algorithm is elaborated to establish the nanobridge span length and to identify the boundary conditions of the nanobridge fixation. In particular, to realize this algorithm we propose a model of the beam with transformable boundary conditions (between clamped and supported beam model cases) varied by the only fitting parameter. To illustrate the main features of the developed bending-based test method application, the Young’s modulus measurements of mineral chrysotile nanoscrolls, forming the nanobridges across the pores of a track membrane, are presented.
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ACKNOWLEDGMENTS
The author is grateful to Dr. B.O. Shcherbin for conducting AFM studies of chrysotile nanobridges and processing the results obtained, to Dr. M.S. Dunaevskiy for helping in theoretical calculations. The author thanks Ms. T.S. Kunkel, Mr. K.I. Tymoshchuk and especially Dr. A.A. Krasilin and Dr. M.M. Khalisov for the proposed changes in the manuscript.
Funding
The research was supported by the Russian Science Foundation (project no. 19-13-00151).
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Ankudinov, A.V. A New Algorithm for Measuring the Young’s Modulus of Suspended Nanoobjects by the Bending-Based Test Method of Atomic Force Microscopy. Semiconductors 53, 1891–1899 (2019). https://doi.org/10.1134/S1063782619140021
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DOI: https://doi.org/10.1134/S1063782619140021