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Statistical Model of the Discrete Multiple Scattering of Charged Particles in a Substance Layer

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Abstract

The results of using a fundamentally new approach to describe the discrete processes of the multiple scattering of a directed proton beam in a substance layer are presented. The basic parameter is the average number of interactions experienced by particles in a film of known thickness. This makes it possible to effectively calculate the energy and angular distributions of fast particles passing through the film in a form corresponding to the experimental spectra.

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Funding

The work was supported by the Ministry of Science and Higher Education of the Russian Federation.

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Authors and Affiliations

  1. Shubnikov Institute of Crystallography, Federal Scientific Research Center “Crystallography and Photonics”, Russian Academy of Sciences, 119333, Moscow, Russia

    N. N. Mikheev

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  1. N. N. Mikheev
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Correspondence to N. N. Mikheev.

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Translated by L. Chernikova

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Mikheev, N.N. Statistical Model of the Discrete Multiple Scattering of Charged Particles in a Substance Layer. J. Surf. Investig. 16, 611–617 (2022). https://doi.org/10.1134/S1027451022030296

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  • DOI: https://doi.org/10.1134/S1027451022030296

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