Abstract
The development of high voltage direct current (HVDC) transmission technology in China has put forward higher requirements to the properties of HVDC cable, the cross-linked polyethylene (XLPE) materials have drawn extensive attention for their excellent properties, and its interface space charge accumulation as well as field distribution have become a hot topic. Aiming at revealing the transport characteristics of space charge in 320 kV XLPE cable, the bipolar charge transport model has been extended to a cylindrical configuration with several modifications, featuring charge injection, trapping, detrapping and recombination. Furthermore, by setting parameters such as trap coefficient, trap depth, injection barrier height, and mobility related to material cross-linking, cable thermal aging, and nanoparticle doping, the space charge transport characteristics are simulated. The results show that the space charge density at the electrodes is decreased by the low trapping coefficient, shallow trap depth, high injection barrier, and high mobility. Therefore, the design of cable can be guided by the selection of cross-linked materials, thermal aging resistance and doping nanoparticles.
Similar content being viewed by others
REFERENCES
Z. L. Li and B. X. Du, IEEE Electr. Insul. Mag. 34, 30 (2018).
D. Fabiani, G. C. Montanari, C. Laurent, G. Teyssedre, and U. H. Nilsson, IEEE Electr. Insul. Mag. 23, 11 (2007).
B. X. Du, Z. L. Li, Z. R. Yang, and J. Li, High Voltage Eng. 43, 344 (2018).
A. Hedir, M. Moudoud, O. Lamrous, S. Rondot, O. Jbara, and P. Dony, J. Appl. Polym. Sci. 137, 48575 (2020).
O. A. Lambri, F. G. Bonifacich, J. A. García, E. D. V. Giordano, G. I. Zelada, F. A. Sánchez, R. R. Mocellini, and F. Plazaola, J. Appl. Polym. Sci. 136, 47605 (2019).
G. Chen and J. W. Zhao, J. Phys. D: Appl. Phys. 44, 212001 (2011).
G. C. Montanari, IEEE Trans. Dielectr. Electr. Insul. 18, 339 (2011).
Y. W. Zhang, J. Lewiner, C. Alquie, and N. Hampton, IEEE Trans. Dielectr. Electr. Insul. 3, 778 (1996).
X. Y. Zhong, Y. S. Zheng, B. Dang, X. R. Miao, and J. L. He, P. CSEE 36, 6693 (2016).
M. J. P. Jeroense and P. H. F. Morshuis, IEEE Trans. Dielectr. Electr. Insul. 5, 225 (1998).
T. N. Vu, G. Teyssedre, B. Vissouvanadin, S. L. Roy, and C. Laurent, IEEE Trans. Dielectr. Electr. Insul. 22, 117 (2015).
J. M. Alison and R. M. Hill, J. Phys. D. Appl. Phys. 27, 1291 (1999).
F. Baudoin, S. L. Roy, G. Teyssedre, and C. Laurent, J. Phys. D. Appl. Phys. 41, 025306 (2008).
J. Li, H. C. Liang, B. X. Du, P. X. Song, X. X. Kong, and Z. L. Li, High Voltage Eng. 44, 1443 (2018).
S. L. Roy, G. Teyssedre, and C. Laurent, IEEE Trans. Dielectr. Electr. Insul. 23, 2361 (2016).
Y. P. Zhan, G. Chen, and M. Hao, IEEE Trans. Dielectr. Electr. Insul. 26, 43 (2019).
E. Belgaroui, I. Boukhris, A. Kallel, G. Teyssedre, and C. Laurent, J. Phys. D. Appl. Phys. 40, 6760 (2007).
F. Q. Tian and C. Y. Hou, IEEE Trans. Dielectr. Electr. Insul. 25, 2169 (2018).
F. Baudoin, S. L. Roy, G. Teyssedre, and C. Laurent, J. Phys. D. Appl. Phys. 41, 025306 (2008).
S. L. Roy, P. Segur, G. Teyssedre, and C. Laurent, J. Phys. D: Appl. Phys. 37, 298 (2004).
S. L. Roy, F. Baudoin, V. Griseri, C. Laurent, and G. Teyssedre, J. Phys. D: Appl. Phys. 112, 351 (2012).
F. Baudoin, G. Teyssedre, C. Laurent, S. L. Roy, L. A. Dissado, P. Ségur, and G. C. Montanar, J. Phys. D: Appl. Phys. 100, 104105 (2006).
D. Fabiani, G. C. Montanari, C. Laurent, G. Teyssedre, P. H. F. Morshuis, R. Bodega, and L. A. Dissado, IEEE Electr. Insul. Mag. 24, 5 (2008).
W. J. Mei, J. Di, W. P, Li, D. W. Sun, W. Pan, and K. Y. Liang, Insul. Mater. 54, 56 (2021).
X. J. Cai, X. X. Wang, D. Pang, X. B. Zou, and Z. W. Lu, Mater. Res. Express 6, 096451 (2019).
S. L. Roy, G. Teyssedre, and C. Laurent, IEEE Trans. Dielectr. Electr. Insul. 13, 239 (2006).
R. Bodega, PhD Thesis (Delft Univ. Technol., Delft, 2016).
L. Lan, J. D. Wu, Y. Yin, and Q. X. Zhong, Jpn. J. Appl. Phys. 51, 041602 (2012).
Y. P. Zhan, G. Chen, M. Hao, L. Pu, X.F. Zhao, S. Wang and J. Liu, Energies 13, 1906 (2020).
Y. X. Zhou, Y. Wu, L. Zhang, Y. X. Zhang, X. Huang, and C. Y. Teng, Insul. Mater. 55, 23 (2022).
G. C. Montanari, C. Laurent, G. Teyssedre, A. Campus, and U. H. Nilsson, IEEE Trans. Dielectr. Electr. Insul. 12, 438 (2005).
Y. Liu, H. Liu, L. Yu, Y. Li, and L. Gao, IEEE Trans. Dielectr. Electr. Insul. 24, 1355 (2017).
H. Li, J. Y. Li, Y. X. Ma, and Q. M. Yan, CSEE J. Power Energy Syst. 33, 6740 (2017).
Funding
This work was supported by Natural Science Foundation of Liaoning Province under Contract no. 2020-MS-214 and Program for Innovative Talents in University of Liaoning Province under the Grant LR2019047.
Author information
Authors and Affiliations
Contributions
All authors contributed to the study conception and design. Formal analysis and investigation were performed by Xinjing Cai and Yuqi Liu. The first draft of the manuscript was written by Yuqi Liu and all authors commented on previous versions of the manuscript. All authors read and approved the final manuscript.
Corresponding author
Ethics declarations
The authors declare that they have no conflict of interest.
Rights and permissions
About this article
Cite this article
Yuqi Liu, Cai, X. & Cai, S. Analysis of Influence Factors on Space Charge Accumulation Characteristics of 320 kV XLPE Cable. Polym. Sci. Ser. A 64, 415–423 (2022). https://doi.org/10.1134/S0965545X22700316
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S0965545X22700316