Abstract
This paper presents the results of the study of the long-term relaxation states of metallic palladium-based foil filters (Pd, 9.6 at %; Y and Pd, 5.3 at %; In, 0.5 at %; Ru) after hydrogenation (82 000 and 58 500 h, respectively) using X-ray diffraction and synchrotron radiation (SR). We analyzed the normalized integral intensities of diffraction maxima for two orders of reflections from coherent scattering regions (CSRs) along crystallographic directions [111] and [100].
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Translated by E. Glushachenkova
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Akimova, O.V., Veligzhanin, A.A. X-Ray Diffraction Studies of Metallic Palladium-Based Foil Filters Using Synchrotron Radiation. Phys. Metals Metallogr. 119, 837–841 (2018). https://doi.org/10.1134/S0031918X18090028
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DOI: https://doi.org/10.1134/S0031918X18090028