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Measurement of the Distribution Profile of Electroluminescence Cutoff Frequencies over the Area of a Light-Emitting Heterostructure

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Abstract

A hardware–software complex that has no analogues in Russia and abroad and that is designed to measure the distribution of the cutoff frequency of electroluminescence over the area of a light-emitting heterostructure (LHS) is described. The complex provides a spatial resolution of 0.65 µm, an upper measurement limit of 40 MHz, and a relative error of 2%. The electroluminescence cutoff frequency in local areas of an LHS is determined from the decay of the brightness of pixels of LHS images by 1.19 times obtained using a digital CMOS camera with a step-by-step increase in the pulse repetition rate of the LHS-supplying current with an off-duty factor of 2. The complex and the measurement method were tested on commercial green light-emitting diodes. The results of measuring the cutoff-frequency distribution can be used to assess the homogeneity of LHSs.

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REFERENCES

  1. Tian, P., Edwards, P.R., Wallace, M.J., Martin, R.W., McKendry, J.J.D., Gu, E., Dawson, M.D., Qiu, Z.-J., Jia, C., Chen, Z., Zhang, G., Zheng, L., and Liu, R., J. Phys. D: Appl. Phys., 2017, vol. 50, p. 075101. https://doi.org/10.1088/1361-6463/50/7/075101

    Article  ADS  Google Scholar 

  2. Gelžinytė, K., Ivanov, R., Marcinkevičius, S., Zhao, Y., Becerra, D.L., Nakamura, S., Den Baars, S.P., and Speck, J.S., J. Appl. Phys., 2015, vol. 117, p. 023111. https://doi.org/10.1063/1.4905854

    Article  ADS  Google Scholar 

  3. Peng, Z., Lu, Y., Gao, Y., Chen, G., Zheng, J., Guo, Z., Lin, Y., and Chen, Z., IEEE Photonics J., 2018, vol. 10, p. 8201908. https://doi.org/10.1109/JPHOT.2018.2880319

    Article  Google Scholar 

  4. Li, Y., Tang, W., Zhang, Y., Guo, M., Li, Q., Su, X., Li, A., and Yun, F., Nanomaterials, 2019, vol. 9, p. 633. https://doi.org/10.3390/nano9040633

    Article  Google Scholar 

  5. Jeong, H. and Jeong, M.S., J. Alloys Compd., 2016, vol. 660, p. 480. https://doi.org/10.1016/j.jallcom.2015.11.151

    Article  Google Scholar 

  6. Lin, Y., Tu, Y., Wu, T., Xiao, Y., Peng, Z., Lu, Y., and Chen, Z., Proc. SPIE, 2018, vol. 10554, p. 1055416. https://doi.org/10.1117/12.2281120

    Article  Google Scholar 

  7. Meng, X., Wang, L., Hao, Z., Luo, Y., Sun, C., Han, Y., Xiong, B., Wang, J., and Li, H., Appl. Phys. Lett., 2016, vol. 108, p. 013501. https://doi.org/10.1063/1.4939593

    Article  ADS  Google Scholar 

  8. Schubert, F., Light-Emitting Diodes, Cambridge: Cambridge Univ. Press, 2006.

    Book  Google Scholar 

  9. Monavarian, M., Rashidi, A., Aragon, A.A., Nami, M., Oh, S.H., DenBaars, S.P., and Feezell, D., Appl. Phys. Lett., 2018, vol. 112, p. 191102. https://doi.org/10.1063/1.5032115

    Article  ADS  Google Scholar 

  10. David, A. and Grundmann, M.J., Appl. Phys. Lett., 2010, vol. 96, p. 103504. https://doi.org/10.1063/1.3330870

    Article  ADS  Google Scholar 

  11. GOST (State Standard) no. 18986.14-85: Semiconductor Diodes. Methods for Measuring Differential and Slope Resistances, Moscow: Izd. Standartov, 2004.

  12. Sergeev, V.A. and Frolov, I.V., RF Patent 2725613, Byull. Izobret., 2020, no. 19.

  13. Zhao, L.X., Zhu, S.C., Wu, C.H., Yang, C., Yu, Z.G., Yang, H., and Liu, L., Sci. China: Phys., Mech. Astron., 2016, vol. 59, p. 107301. https://doi.org/10.1063/1.4993230

    Article  Google Scholar 

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Funding

This study was performed within the framework of a State Task and supported in part by the Russian Foundation for Basic Research, project no. 19-07-00562 A.

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Authors and Affiliations

  1. Kotelnikov Institute of Radio Engineering and Electronics, Ulyanovsk Branch, Russian Academy of Sciences, 432011, Ulyanovsk, Russia

    I. V. Frolov, V. A. Sergeev & O. A. Radaev

  2. Ulyanovsk State Technical University, 432027, Ulyanovsk, Russia

    I. V. Frolov & V. A. Sergeev

Authors
  1. I. V. Frolov
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  2. V. A. Sergeev
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  3. O. A. Radaev
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Corresponding author

Correspondence to V. A. Sergeev.

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Translated by A. Seferov

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Frolov, I.V., Sergeev, V.A. & Radaev, O.A. Measurement of the Distribution Profile of Electroluminescence Cutoff Frequencies over the Area of a Light-Emitting Heterostructure. Instrum Exp Tech 64, 259–263 (2021). https://doi.org/10.1134/S0020441221010231

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