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Beam-induced HOM power in CEPC collider ring cavity

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Radiation Detection Technology and Methods Aims and scope Submit manuscript

Abstract

Background

The power loss of cavity high-order modes (HOMs) is a key issue in Circular Electron and Positron Collider (CEPC) RF system design. A large HOM power may cause a quench of SC cavity.

Purpose

The purpose of this article is to study the beam-induced HOM power for CEPC collider ring. The factors influencing the cavity HOM power are also investigated.

Methods

Starting with the beam filling patterns, the beam spectrums of different beam time structures are deduced. Then, the longitudinal impedance is simulated for CEPC 2-cell 650 MHz cavity. Finally, the cavity HOM power is calculated for CEPC CDR design.

Results

The cavity HOM power is 459 W for Higgs, 506 W for W and 1026 W for Z-pole. These values are smaller than the average values. There is no overlap between beam spectral lines and cavity HOM frequency.

Conclusion

The filling patterns of CEPC CDR Higgs, W and Z are safe. The dangerous filling patterns can be identified for CEPC Z-pole by scanning different parameters.

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Author information

Authors and Affiliations

  1. Key Laboratory of Particle Acceleration Physics and Technology, Institute of High Energy Physics, Chinese Academy of Sciences, 19B Yuquan Road, Beijing, 10049, China

    Dianjun Gong

  2. University of Chinese Academy of Sciences, 19A Yuquan Road, Beijing, 10049, China

    Dianjun Gong, Jie Gao, Hongjuan Zheng, Jiyuan Zhai & Peng Sha

Authors
  1. Dianjun Gong
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  2. Jie Gao
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  3. Hongjuan Zheng
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  4. Jiyuan Zhai
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  5. Peng Sha
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Corresponding author

Correspondence to Dianjun Gong.

Additional information

This study was supported by National Key Programme for S&T Research and Development (Grant No. 2016YFA0400400), National Natural Science Foundation of China (No. 11575218), Key research Program of Frontier Science, CAS (Grant No. QYZDJ-SSW-SLH004).

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Gong, D., Gao, J., Zheng, H. et al. Beam-induced HOM power in CEPC collider ring cavity. Radiat Detect Technol Methods 3, 18 (2019). https://doi.org/10.1007/s41605-019-0098-y

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  • DOI: https://doi.org/10.1007/s41605-019-0098-y

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