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A Laser Multi-Reflection Technique Applied for Liquid Film Flow Measurements

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Abstract

This work is devoted to a non-intrusive experimental approach, based on Laser Multi-reflection technique, in the investigation of thickness distribution variations and wave’s dynamics of a liquid film flowing over an inclined plane. This investigation was first founded on the needs of quantifying the liquid film thickness and on minimizing, as much as possible, some drawbacks pointed out, in the literature, throughout the experimental techniques available. Moreover, the technique could be applied to transparent, opaque as well as particle laden liquid films. The technique is validated and evaluated using two approaches according to the flow case: stable or instable. In case of stable flow, the comparison was made using Spectroscopic Ellipsometry and theoretical prediction established by the Nusselt model. For a wavy interface a setup, especially devoted to that purpose, was used to validate the accuracy of the measurements. In both cases the uncertainties were within 5%. The experiments are discussed hereafter including the accuracy of the results. Some experimental data, for plane inclination ranging from 1° to 10°, are reported. The data takes into account the film thickness at various positions. The instability threshold is also reported.

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Abbreviations

A:

Wave amplitude

E:

Solid samples thickness [mm]

ES.E :

Solid samples thickness measured by S. E [mm]

f:

Wave’s frequency [Hz]

fc :

Camera’s acquisition frequency [Hz]

fmax :

Highest frequency present in the flow [Hz]

g = 9.81 m/s2 :

Gravity

h:

Liquid film thickness [mm]

h0 :

Mean liquid film thickness [mm]

hn :

Film thickness from Nusselt expression [mm]

hmax :

Maximum liquid film thickness [mm]

ℓ:

Distance separating on the screen the reflected spot of the upper plate and the reflected spot of the liquid free surface.

L:

Channel height (distance (in “mm”) separating both plates).

P:

Laser’s power [W]

Q:

Flow rate per unit width [m2/s]

\( \mathit{\operatorname{Re}}=\frac{\rho\ U\ {h}_0}{\mu } \) :

Reynolds number

t:

Time [s]

X1,…,6 = 19 cm, 26 cm, 31 cm, 35 cm, 39 cm and 43 cm:

Measurements positions [cm]

x,y,z:

Space- coordinates

λ:

Wave’s length [cm]

ρ:

Water density [998.2 Kg/m3]

σ:

Surface tension at water-air interface [0.072 N/m]

μ:

Water dynamic viscosity [1.002 10−3 Pa s]

τ:

Plate thickness

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Acknowledgments

The Authors would like to acknowledge the team of “Semiconductors Thin Film” of Materials laboratory for their valuable help with the S.E. technique and samples preparations as well as the Optics Laboratory of the physics Faculty of USTHB.

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Authors and Affiliations

  1. USTHB-Faculty of Physics Laboratory of Theoretical and Applied Fluid Mechanics, B.P. 32 El-Alia, 16111, Alger, Algeria

    H. Ouldrebai, E.K. Si-Ahmed, M. Hammoudi & Y. Salhi

  2. University of Nantes, CNRS, GEPEA, UMR-6144, 37, Bd de l’Université BP 406, 44602, Saint-Nazaire, France

    E.K. Si-Ahmed, J. Legrand & J. Pruvost

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  1. H. Ouldrebai
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  2. E.K. Si-Ahmed
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  3. M. Hammoudi
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  4. J. Legrand
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  5. Y. Salhi
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  6. J. Pruvost
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Correspondence to E.K. Si-Ahmed.

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Ouldrebai, H., Si-Ahmed, E., Hammoudi, M. et al. A Laser Multi-Reflection Technique Applied for Liquid Film Flow Measurements. Exp Tech 43, 213–223 (2019). https://doi.org/10.1007/s40799-018-0279-5

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