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Optical properties of electron beam evaporated Zn1−XTiXO thin films

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Abstract

The present study deals with synthesis and characterizations of titanium (Ti) doped zinc oxide (Zn1−xTixO) thin films using an electron beam evaporation technique. The Zn1−xTixO thin films were prepared at different titanium concentrations (x = 0. 00, 0.01, 0.05 and 0.07) and studied the role of Ti concentration on structural, morphological, optical, photoluminescence, magnetic and electrical properties. The Zn1−xTixO thin films were subjected to XRD, SEM, AFM, UV–Vis–NIR, PL, VSM and I–V characterization techniques. From these characterizations it was found that the Zn1−xTixO thin films were in wurtzite hexagonal structure with smooth surface. An increase in optical band gap (3.01 eV – 3.13 eV) and a decrease in crystallite size (25–19 nm) were observed with increase of Ti concentration (x = 0.00 to x = 0.07). The films exhibit luminescence property and clear emission peaks were observed in PL spectra in visible region. From I-V studies, ohmic behavior was observed for the Zn1−xTixO thin films. Magnetic studies were carried out at room temperature and confirmed the paramagnetic nature of the Zn1−xTixO thin films. From the optical transmittance, absorbance spectra of the Zn1−xTixO thin films, the optical parameters such as refractive index, extinction coefficient, energy band gap, Urbach energy, optical conductivity, dispersion parameter, static refractive index, linear and non-linear susceptibility were calculated and explained in detail.

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Authors and Affiliations

  1. Thin Films Laboratory, School of Advanced Sciences, Vellore Institute of Technology, Vellore, 632 014, Tamil Nadu, India

    G. Soniya Pauline

  2. Thin Films Laboratory, Centre for Functional Materials, Vellore Institute of Technology, Vellore, 632 014, Tamil Nadu, India

    S. Kaleemulla

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  1. G. Soniya Pauline
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  2. S. Kaleemulla
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Correspondence to S. Kaleemulla.

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Pauline, G.S., Kaleemulla, S. Optical properties of electron beam evaporated Zn1−XTiXO thin films. Indian J Phys 98, 2163–2179 (2024). https://doi.org/10.1007/s12648-023-02991-7

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