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Exploring the Self-Heating Effects & Its Impact on Thermal Noise for Dielectric Pocket Packed Double-Gate-All-Around (DPP-DGAA) MOSFETs

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Abstract

Dielectric Pocket Packed Double-Gate-All-Around (\({\varvec{D}}{\varvec{P}}{\varvec{P}}-{\varvec{D}}{\varvec{G}}{\varvec{A}}{\varvec{A}}\)) MOSFETs are one of the preferred choices for ULSI applications because of significantly low off-current, reduced power dissipation, and high immunity to short channel effect. However, \({\varvec{D}}{\varvec{P}}{\varvec{P}}-{\varvec{D}}{\varvec{G}}{\varvec{A}}{\varvec{A}}\) suffer from self-heating due to the unavailability of appropriate heat take-out tracks. This Paper analysis the effect of self-heating (SHEs) for \({\varvec{D}}{\varvec{P}}{\varvec{P}}-{\varvec{D}}{\varvec{G}}{\varvec{A}}{\varvec{A}}\) MOSFETs by electro-thermal (ET) simulations with hydrodynamic and thermodynamic transport models. The electrothermal characteristics against various device dimensions such as spacer size, device width,thermal resistance of the contacts, and drain voltage have been investigated. The effect of SHE on the drive current has also been evaluated. Further, Self-heating impacts on thermal noise have been analyzed in detail using Sentauras TCAD simulator.

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The data and material are available within the manuscript.

The authors declare that all procedures followed were in accordance with the ethical standards.

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Authors and Affiliations

  1. Department of Electronics & Communication, Pranveer Singh Institute of Technology, Kanpur (A.K.T.U. Lucknow), Kanpur, India

    Vaibhav Purwar

  2. Department of Electronics Engineering, Rajasthan Technical University, Kota, Rajasthan, 324010, India

    Rajeev Gupta

  3. Department of Electrical Engineering, Indian Institute of Technology Patna, Bihar, India

    Pramod Kumar Tiwari

  4. Department of Physics, L.N.D. College Motihari (B.R.A. Bihar University), Bihar, 845401, India

    Sarvesh Dubey

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  1. Vaibhav Purwar
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  4. Sarvesh Dubey
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All authors have made substantial contributions to the conception and design, or acquisition of data, or analysis and interpretation of data; have been involved in drafting the manuscript or revising it critically for important intellectual content; and have given final approval of the version to be published. Each author has participated sufficiently in the work to take public responsibility for appropriate portions of the content. All authors read and approved the final manuscript.

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Purwar, V., Gupta, R., Tiwari, P.K. et al. Exploring the Self-Heating Effects & Its Impact on Thermal Noise for Dielectric Pocket Packed Double-Gate-All-Around (DPP-DGAA) MOSFETs. Silicon 14, 10217–10224 (2022). https://doi.org/10.1007/s12633-022-01727-2

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