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Structural and Optical Characterization of Chemically Deposited PbS Thin Films

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Abstract

PbS thin films were deposited on glass substrates by a chemical bath deposition method. The effect of varying the film thickness on the structural and optical properties has been investigated. XRD analysis reveals the crystallinity of the deposited PbS films with (200) preferred crystal orientation. Increasing the film thickness enhances the crystallinity of the films as well as decreases the strain and dislocation density. The surface morphology features were dramatically changed from small spherical grains to bead-like shape. The absence of impurities in the deposited films was confirmed by energy dispersive x-ray spectrometry (EDX) measurements. The optical constants of the deposited films were calculated and a small decrease in the band gap energy was observed with increasing the film thickness.

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Authors and Affiliations

  1. Physics Department, Faculty of Science, Suez Canal University, 41522, Ismailia, Egypt

    A. N. Fouda & H. M. Abd El-Khalek

  2. Recruitment Department, University of Hail, Hail 2440, KSA, Hail, Saudi Arabia

    A. N. Fouda

  3. Basic Science Department, Faculty of Petroleum and Mining Engineering, Suez University, 43721, Suez, Egypt

    M. Marzook & S. Ahmed

  4. Department of Basic Science, Higher Technological Institute, 10th of Ramadan City, Ramadan, Egypt

    E. A. Eid

  5. Basic Science Department, Faculty of Industrial Education, Helwan University, 11813, Cairo, Egypt

    A. B. El Basaty

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  1. A. N. Fouda
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  2. M. Marzook
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  3. H. M. Abd El-Khalek
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  4. S. Ahmed
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  5. E. A. Eid
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  6. A. B. El Basaty
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Correspondence to A. N. Fouda.

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Fouda, A.N., Marzook, M., Abd El-Khalek, H.M. et al. Structural and Optical Characterization of Chemically Deposited PbS Thin Films. Silicon 9, 809–816 (2017). https://doi.org/10.1007/s12633-015-9399-z

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  • DOI: https://doi.org/10.1007/s12633-015-9399-z

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