Abstract
In this investigation, we describe a spectroscopic imaging ellipsometry for large area measurements, named as large area spectroscopic ellipsometry (LASIE). LASIE uses a broadband light source and an imaging spectrometer in order to obtain the spectral-spatial intensity images corresponding to a measurement line of a specimen and it can characterize the 3D multi-film structures with the aid of lateral scanning. Opposed to the typical high resolution imaging ellipsometry with the small field of view (FOV), LASIE uses a low magnification imaging lens to enlarge the measurement area and line profiles of multi-layered film structure can be reconstructed at a single operation based on the operation of the spectroscopic imaging spectrometer. In the experiment, 3- and 4-layered film specimen were measured after the system calibration and the 3D film thickness profiles of all film layers were obtained with 1 nm repeatability.
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Abbreviations
- ρ :
-
the ratio between Fresnel reflection coefficients of p- and s-waves
- r :
-
the Fresnel reflection coefficient
- δ :
-
the phase retardation by film layer
- \(\tilde S\) :
-
Jones matrix of a specimen
- Ã:
-
Jones matrix of an analyzer
- \(\tilde P\) :
-
Jones matrix of a polarizer
- x :
-
spatial line coordinate
- λ :
-
wavelength of an optical source
- θ :
-
rotation angle of a compensator
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Kim, D.H., Yun, Y.H. & Joo, KN. LASIE: Large Area Spectroscopic Imaging Ellipsometry for Characterizing Multi-Layered Film Structures. Int. J. Precis. Eng. Manuf. 19, 1125–1132 (2018). https://doi.org/10.1007/s12541-018-0133-9
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DOI: https://doi.org/10.1007/s12541-018-0133-9