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Property elucidation of vacuum-evaporated zinc telluride thin film towards optoelectronic devices

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Abstract

A thermal vacuum evaporation system has been used to deposit zinc telluride (ZnTe) thin film on glass substrate in order to investigate the structural, morphological, optoelectronic and electrical properties of the deposited film. The deposited film has been characterised by X-ray diffraction (XRD), atomic force microscopy (AFM), and UV-VIS-NIR spectrophotometer. The polycrystalline and cubic structure of the sample has been confirmed by XRD. The order parameter(s), which determines the crystallinity and good environmental stability of the sample, has been obtained for the peak (1 1 1) to peak (2 0 0) and is found to be 0.83. The XRD patterns and Bragg’s law have been examined to determine the microstructural parameters (lattice parameter, inter-planar spacing, crystallite size, number of crystallites per unit area, strain, dislocation density) of the investigated film. Optical properties (transmittance, absorbance, refractive index, absorption coefficient, extinction coefficient, optical density) of ZnTe thin film were extensively studied in incident photon energy range of 0.5–3.5 eV, where direct optical transition has been obtained with a band gap of 2.63 eV. The surface morphology of the evaporated ZnTe thin film has been checked by AFM.

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Acknowledgements

Part of this work was carried out in the Materials Science Division, Atomic Energy Center, Dhaka, Bangladesh. The authors are grateful to the concerned authority and laboratory staff of Bangladesh Council of Scientific and Industrial Research (BCSIR) and Bangladesh University of Engineering and Technology (BUET) for their support, cooperation and technical assistance in experimental measurements.

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Authors and Affiliations

  1. Department of Applied Physics, Electronics and Communication Engineering, University of Chittagong, Chittagong, 4331, Bangladesh

    J U Ahamed & N P Begum

  2. Materials Science Division, Atomic Energy Center, Dhaka, Bangladesh

    M N I Khan

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  1. J U Ahamed
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  2. N P Begum
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  3. M N I Khan
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Correspondence to J U Ahamed.

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Ahamed, J.U., Begum, N.P. & Khan, M.N.I. Property elucidation of vacuum-evaporated zinc telluride thin film towards optoelectronic devices. Sādhanā 42, 1773–1781 (2017). https://doi.org/10.1007/s12046-017-0717-6

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  • DOI: https://doi.org/10.1007/s12046-017-0717-6

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