Abstract
We have studied the capacitance behavior of alkanethiol self-assembled monolayer (SAM)-covered Au film by scanning tunneling microscope light emission (STM-LE) spectroscopy in the Kretschmann geometry. Although, the STM-LE from tip-sample gap into the vacuum (tip-side emission) is fundamentally weak and very difficult to detect, we have succeeded in detecting the STM-LE radiated into the prism (prism-side emission) by virtue of the enhancement of prism-coupled geometry. Our experimental results shows that the cutoff energy of STM-LE spectra have been redshifted with increase in thickness (chain length) of the SAM film. In order to explain the cutoff energy shift, we have designed a two-layer tunnel junction model by considering the capacitance response of the SAM film depending on the molecular chain length. It has been found from the model analysis, that the capacitance of the SAM changes with changing of the molecular thickness. Hence, it is concluded that the shift of the cutoff energy has originated from the change of the capacitance of the SAM film depending on the molecular chain length.
Similar content being viewed by others
References
Fan F F, Yang J, Cai L, Price D W, Dirk S M, Kosynkin D V, Yao Y, Rawlett A M, Tour J M, and Bard A J, J Am Chem Soc 124 (2002) 5550.
Dubois L H, and Nuzzo R G, Annu Rev Phys Chem 43 (1992) 437.
Zharnikov M, and Grunze M, J Phys Condens Matter 13 (2001) 11333.
Willey T M, Vance A L, Buuren T van, Bostedt C, Nelson A J, Terminello L J, and Fadley C S, Langmuir 20 (2004) 2746.
Reed M A, and Lee T (Eds.), Molecular Nanoelectronics, American Scientific Publishers, Stevenson Ranch, CA (2003), p 145.
Nitzan A, and Ratner M A, Science 300 (2003) 1384.
Akkerman H B, Blom P W M, Leeuw D M de, and Boer B de, Nature 441 (2006) 69.
Beebe J M, Kim B, Gadzuk J W, Frisbie C D, and Kushmerick J G, Phys Rev Lett 97 (2006) 026801.
Yan H, Bergren A J, McCreery R, Rocca M L D, Martin P, Lafarge P, and Lacroix J C, PNAS 110 (2013) 5326.
Jiang J, Lu W, and Luo Y, Chem Phys Lett 400 (2004) 336.
Love J C, Estroff L A, Kriebel J K, Nuzzo R G, and Whitesides G M, Chem Rev 105 (2005) 1103.
Pensa E, Vericat C, Grumelli D, Salvarezza R C, Park S H, Longo G S, Szleifer I, and Leo L P M D, Phys Chem Chem Phys 14 (2012) 12355.
Guo, and Li F, Phys Chem Chem Phys 16 (2014) 19074.
Romaner L, Heimel G, Ambrosch-Draxl C, Zojer E, Adv Funct Mater 18 (2008) 3999.
Tomfohr J K, and Sankey O F, Phys Rev B 65 (2002) 245105.
Boubour E, Lennox R B, Langmuir 16 (2000) 4222.
Porter M D, Bright T B, Allara D L, Chidsey C E D, J Am Chem Soc 109 (1987) 3559.
Berggren C, Bjarnason B, and Johansson G, Electroanalysis 13 (2001) 173.
Maisch S, Buckel F, and Effenberger F, J Am Chem Soc 127 (2005) 17315.
Coombs J H, Gimzewski J K, Reihl B, Sass J K, and Schlittler R R, J Microsc 152 (1988) 325.
Uehara Y, Ito K, and Ushioda S, Appl Surf Sci 107 (1996) 247.
Kretschmann E, Z Physik 241 (1971) 313 [in German].
Ahamed J U, Sanbongi T, Katano S, and Uehara Y, Jpn J Appl Phys 49 (2010) 08LB09.
Uehara Y, Watanabe J, Fujikawa S, and Ushioda S, Phys Rev B 51 (1995) 2229.
Ahamed J U, Katano S, and Uehara Y, Bull Mater Sci 38 (2015) 1271.
Takeuchi K, Uehara Y, Ushioda S, and Morita S, J Vac Sci Technol B 9 (1991) 557.
Ekvall I, Wahlström E, Claesson D, Olin H, and Olsson E, Meas Sci Technol 10 (1999) 11.
Porath D, Goldstein Y, Grayevsky A, and Millo O, Surf Sci 321 (1994) 81.
Allen F H, Kennard O, Watson D G, Brammer L, Orpen A G, and Taylor R, J Chem Soc, Perkin Trans 2 (1987) S1.
Burkert U, and Allinger N L, Molecular Mechanics, ACS Monograph, American Chemical Society, Washington, DC (1982), p 177.
Johnson P B, and Christy R W, Phys Rev B 6 (1972) 4370.
Lynch D W, and Hunter W R, Handbook of Optical Constants of Solids, ed Palik E D, Academic Press, New York (1985), p 357.
Akkerman H B, Naber R C G, Jongbloed B, Hal P A van, Blom P W M, Leeuw D M de, and Boer B de, Proc Natl Acad Sci USA 104 (2007) 11161.
Slowinski K, Chamberlain R V, Miller C J, and Majda M, J Am Chem Soc 119 (1997) 11910.
Becker R S, Golovchenko J A, and Swartzentruber B S, Phys Rev Lett 55 (1985) 987.
Lutwyche M I, and Wada Y, J Vac Sci Technol B 13 (1995) 2819.
Hicks J F, Templeton A C, Chen S W, Sheran K M, Jasti R, Murray R W, Debord J, Scaaf T G, and Whetten R L, Anal Chem 71 (1999) 3703.
Sahalov H, O’Brien B, Stebe K J, Hristova K, and Searson P C, Langmuir 23 (2007) 9681.
Acknowledgments
Part of this work was carried out in the Nano-Photoelectronics Laboratory, Tohoku University, Japan and was supported in part by the Tohoku University Electro-Related Departments Global COE Program. The Authors would like to thank Mr. Tomonori Sanbongi and Wataru Iida for their cooperation and technical assistance.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Ahamed, J.U., Katano, S. & Uehara, Y. Capacitance Behavior of Alkanethiol Self-Assembled Monolayer Studied by Scanning Tunneling Microscope Light Emission Spectroscopy. Trans Indian Inst Met 69, 1579–1585 (2016). https://doi.org/10.1007/s12666-015-0733-3
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s12666-015-0733-3