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3D laser scanning confocal microscopy of siloxane-based comb and double-comb polymers in PVDF-HFP thin films

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Abstract

Currently, atomic force microscopy is the preferred technique to determine roughness on membrane surfaces. In this paper, a new method to measure surface roughness is presented using a 3D laser scanning confocal microscope for high-resolution topographic analysis and is compared to conventional SEM. For this study, the surfaces of eight samples based on a poly(vinylidene fluoride-co-hexafluoropropylene) (PVDF-HFP) host polymer with different liquid interpenetrating components were analyzed. Polymethylhydrosiloxane, triethylene glycolallylmethylether, (3,3,3-trifluoropropyl)methylcyclotrisiloxane (D3-C2H4CF3), polysiloxane-comb-propyloxymethoxytriglycol (PSx), polysiloxane-comb-propyl-3,3,3-trifluoro (PSx-C2H4CF3), poly[bis(2-(2-methoxyethoxy) ethoxy) phosphazene, or poly[bis(trifluoro)ethoxy] phosphazene was chosen as interpenetrating compound to investigate the impact of comb and double-comb-structured polymer backbones, as well as their dipolar or fluorous residues on the PVDF-HFP-miscibility. Different phases of the constituting ingredients were identified via their thermal properties determined by DSC. Additionally, the COSMO-RS method supported the experimental results, and with regard to computed σ-profiles, new modified structures for polysiloxane and polyphosphazene synthesis were suggested.

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Acknowledgments

The authors want to thank Hendrik Rönnfeldt and Kai Meine from KEYENCE Microscope Europe for technical support and assistance referring to the 3D laser scanning confocal microscopy. This work was financially supported within BMBF grant 13N13240.

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    Authors and Affiliations

    1. Institute for Inorganic and Analytical Chemistry, University of Münster, Correnstr. 28/30, 48149, Münster, Germany

      Eva Cznotka, Steffen Jeschke, Sebastian Schmohl & Hans-Dieter Wiemhöfer

    2. Department of Applied Physics, Chalmers University of Technology, 41296, Gothenburg, Sweden

      Steffen Jeschke & Patrik Johansson

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    1. Eva Cznotka
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    Correspondence to Eva Cznotka.

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    Eva Cznotka and Steffen Jeschke have contributed equally to this work.

    This paper was presented at the 11th Coatings Science International Conference (COSI) on June 22–26, 2015 in Noordwijk, the Netherlands.

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    Cznotka, E., Jeschke, S., Schmohl, S. et al. 3D laser scanning confocal microscopy of siloxane-based comb and double-comb polymers in PVDF-HFP thin films. J Coat Technol Res 13, 577–587 (2016). https://doi.org/10.1007/s11998-015-9754-4

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