Abstract
This paper investigates the impact of various copper (Cu) pillar bump heights on temperature distribution, deformation and thermal stress during reflow. The virtual reflow oven environment was simulated using the fluid domain of the oven model. The accuracy of the fluid analysis was verified by comparing the obtained results with experimental data, which was conducted based on the Joint Electron Device Engineering Council (JEDEC) Standard. In addition, a grid independence test was carried out on the fluid mesh to determine the optimal mesh size for the simulations. A thermal fluid–structure interaction (FSI) approach was employed to couple the thermal results from the fluid analysis with the solid assembly. The results of the coupling analysis revealed that Cu pillar bumps with a height of 0.09 mm exhibited the lowest reflow temperature, minimal maximum deformation, and thermal stress, indicating that it is the optimal potential height for forming a good joint. The study also examines the impact of soldering materials, such as tin-bismuth (SnBi) and tin-silver-copper solder alloys (SAC305 and SAC405), on the Cu pillar bump. This study enables a comprehensive analysis of the thermal and mechanical performance of different Cu pillar bump parameters during the reflow process.
Similar content being viewed by others
References
M. Datta, Manufacturing processes for fabrication of flip-chip micro-bumps used in microelectronic packaging: an overview. J. Micromanuf. 3(1), 69–83 (2020).
M.I. Ahmad, M.S. Abdul Aziz, M.Z. Abdullah, M. Salleh, M.A. Anuar, M.H.H. Ishak, W. Rahiman, and M. Nabiałek, Investigations of infrared desktop reflow oven with FPCB substrate during reflow soldering process. Metals. 11(8), 1155 (2021).
T.N. Tsai, Modeling and optimization of reflow thermal profiling operation: a comparative study. J. Chinese Inst. Ind. Eng. 26(6), 480–492 (2009).
W.N.C. Weng, in Recent Prog. Solder. Mater., ed. by M. A. A. Mohd Salleh, M. S. Abdul Aziz, A. Jalar, M. I. Izwan Ramli (IntechOpen, London, United Kingdom, 2017), p. 91–108.
H. Yu and J. Kivilathti, CFD modelling of the flow field inside a reflow oven. Solder. Surf. Mt. Technol. 14(1), 38–44 (2002).
Y. Liu and K.N. Tu, Low melting point solders based on Sn, Bi, and In elements. Mater. Today Adv. 8, 100115 (2020).
V. Lin, N. Kao, D. S. Jiang, and C. S. Hsiao, Stress Simulation and Design Optimal Study for Cu Pillar Bump Structure. Paper presented at the 2013 IEEE 15th Electron. Packag. Technol. Conf. (EPTC 2013), Singapore, 11-13 December (2013).
A. Esfandyari, B. Bachy, S. Raithel, A. Syed-Khaja, and J. Franke, Simulation, optimization and experimental verification of the over-pressure reflow soldering process. Paper presented at the 10th CIRP Conf. on Intell. Comput. in Manuf. Eng. (CIRP ICME '16), Ischia, Italy, 20-22 July 2016.
G.Q. Lu, X. Liu, S. Wen, J.N. Calata, and J.G. Bai, Strategies for improving the reliability of solder joints on power semiconductor devices. Solder. Surf. Mt. Technol. 16(2), 27–40 (2004).
C.S. Lau, M.Z. Abdullah, M. Abdul Mujeebu, and NMd. Yusop, Finite element analysis on the effect of solder joint geometry or the reliability of ball grid array assembly with flexible and rigid PCBS. J. Eng. Sci. Technol. 9(1), 47–63 (2014).
W. Xia, M. Xiao, Y. Chen, F. Wu, Z. Liu, and H. Fu, Thermal warpage analysis of PBGA mounted on PCB during reflow process by FEM and experimental measurement. Solder. Surf. Mt. Technol. 26(3), 162–171 (2014).
M.S.A. Aziz, M.Z. Abdullah, C.Y. Khor, and F.C. Ani, Influence of pin offset in PCB through-hole during wave soldering process: CFD modeling approach. Int. Commun. Heat Mass Transf. 48, 116–123 (2013).
M.S. Abdul Aziz, M.Z. Abdullah, C.Y. Khor, A. Jalar, and F. Che Ani, CFD modeling of pin shape effects on capillary flow during wave soldering. Int. J. Heat Mass Transf. 72, 400–410 (2014).
M.S. Abdul Aziz, M.Z. Abdullah, C.Y. Khor, F. Che Ani, and N.H. Adam, Effects of temperature on the wave soldering of printed circuit boards: CFD modeling approach. J. Appl. Fluid Mech. 9(4), 2053–2062 (2016).
C.Y. Khor, M.Z. Abdullah, C.S. Lau, W.C. Leong, and M.S. Abdul Aziz, Influence of solder bump arrangements on molded IC encapsulation. Microelectron. Reliab. 54(4), 796–807 (2014).
C.Y. Khor, M.Z. Abdullah, and W.C. Leong, Fluid/structure interaction analysis of the effects of solder bump shapes and input/output counts on moulded packaging. IEEE Trans. Compon. Packag. Manuf. Technol. 2(4), 604–616 (2012).
Y.S. Son, and J.Y. Shin, Thermal response of electronic assemblies during forced convection-infrared reflow soldering in an oven with air injection. JSME Int. J. Ser B Fluids Therm. Eng. 48(4), 865–873 (2005).
A.M. Najib, M.Z. Abdullah, C.Y. Khor, and A.A. Saad, Experimental and numerical investigation of 3D gas flow temperature field in infrared heating reflow oven with circulating fan. Int. J. Heat Mass Transf. 87, 49–58 (2015).
M.S. Abdul Aziz, M.Z. Abdullah, C.Y. Khor, A. Jalar, F. Che Ani, N. Yan, and C. Cheok, Finite volume-based simulation of the wave soldering process: influence of the conveyor angle on pin-through-hole capillary flow. Numer. Heat Transf. Part A Appl. 69(3), 295–310 (2016).
F. Chong, A. Abas, M.H.H. Ishak, M.Z. Abdullah, and A. Aziz, Effect of thermocapillary action in the underfill encapsulation of multi-stack ball grid array. Microelectron. Reliab. 66, 143–160 (2016).
C. Srivalli, M.Z. Abdullah, and C.Y. Khor, Numerical investigations on the effects of different cooling periods in reflow-soldering process. Heat Mass Transf. 51, 1413–1423 (2015).
M.S. Abdul Aziz, M.Z. Abdullah, C.Y. Khor, Z.M. Fairuz, A.M. Iqbal, M. Mazlan, and M.S.M. Rasat, Thermal fluid-structure interaction in the effects of pin-through-hole diameter during wave soldering. Adv. Mech. Eng. 2014(6), 1–13 (2014).
M.S. Abdul Aziz, M.Z. Abdullah, and C.Y. Khor, Thermal fluid-structure interaction of PCB configurations during the wave soldering process. Solder. Surf. Mt. Technol. 27(1), 31–44 (2015).
M.S. Abdul Aziz, M.Z. Abdullah, C.Y. Khor, I.A. Azid, A. Jalar, and F.C. Che Ani, Influence of printed circuit board thickness in wave soldering. Sci. Iran. 24(6), 2963–2976 (2017).
M.S. Abdul Aziz, M.Z. Abdullah, and C.Y. Khor, Influence of PTH offset angle in wave soldering with thermal-coupling method. Solder. Surf. Mt. Technol. 26(3), 97–109 (2014).
F.X. Che, J.K. Lin, K.Y. Au, H.Y. Hsiao, and X. Zhang, Stress analysis and design optimization for low-k chip with cu pillar interconnection. IEEE Trans. Comp. Packag. Manuf. Technol. 5(9), 1273–1283 (2015).
H. Sun, B. Gao, and J. Zhao, Thermal-mechanical reliability analysis of WLP with fine-pitch copper post bumps. Solder. Surf. Mt. Technol. 33(3), 178–186 (2021).
M. K. Shih and P. C. Hong, Structural design guideline for cu pillar bump reliability in system in packages Module. Paper presented at the 2015 IEEE 17th Electron. Packag. Technol. Conf. (EPTC), Singapore, 2-4 December (2015).
X.J. Long, J.T. Shang, and L. Zhang, Design optimization of pillar bump structure for minimizing the stress in brittle low k dielectric material layer. Acta Metall. Sin. (Engl Lett) 33, 583–594 (2020).
K.M. Chen, C.Y. Wu, C.H. Wang, H.C. Cheng, and N.C. Huang, An RDL UBM structural design for solving ultralow-k delamination problem of Cu pillar bump flip chip BGA packaging. J. Electron. Mater. 43, 4229–4240 (2014).
L. Shi, L. Chen, D.W. Zhang, E. Liu, Q. Liu, and C.I. Chen, Improvement of thermo-mechanical reliability of wafer level chip scale packaging. J. Electron. Packag. 140(1), 011002 (2018).
D.Q. Yu, J. Zhao, and L. Wang, Improvement on the Microstructure Stability, mechanical and wetting properties of Sn–Ag–Cu lead-free solder with the addition of rare earth elements. J. Alloys Compd. 376(1–2), 170–175 (2004).
I. Shohji, T. Osawa, T. Matsuki, Y. Kariya, K. Yasuda, and T. Takemoto, Effect of specimen size and aging on tensile properties of Sn-Ag-Cu lead-free solders. Mater. Trans. 49(5), 1175–1179 (2008).
S.M.L. Nai, J. Wei, and M. Gupta, Effect of carbon nanotubes on the shear strength and electrical resistivity of a lead-free solder. J. Electron. Mater. 37(4), 515–522 (2008).
M. I. Ahmad, Thermal fluid-structure interaction analysis on flexible printed circuit board during reflow Soldering, Dissertation, Universiti Sains Malaysia, (2021).
R. Raj, P. Shrivastava, N. Jindal, S. N. Alam, N. Naithani, M. Padhy, A. S. D. Phani, T. V. V Ramana, and M. M. Abbas, Development and characterization of eutectic Sn-Zn, Sn-Ag, Sn-Bi and Sn-Cu Solder Alloys. Paper presented at the Int. Conf. Process. Charact. Mater. (ICPCM 2018), Rourkela, India, 6-8 December 2018
D. Suraski, Reflow Profiling The Benefits of Implementing a Ramp-to-Spike Profile (2000), https://smtnet.com/library/files/upload/reflow-profiling-ramp. Accessed 20 April 2023.
C.S. Lau, M.Z. Abdullah, and F.C. Ani, Computational fluid dynamic and thermal analysis for BGA assembly during forced convection reflow soldering process. Solder. Surf. Mt. Technol. 24(2), 77–91 (2012).
P.M. Kumar, G. Gergely, D.K. Horváth, and Z. Gácsi, Investigating the microstructural and mechanical properties of pure lead-free soldering. Powder Metall. Prog. 18(1), 49–57 (2018).
S. Zhou, C. Yang, S. Lin, A.N. Alhazaa, O. Mokhtari, X. Liu, and H. Nishikawa, Effects of Ti addition on the microstructure, mechanical properties and electrical resistivity of eutectic Sn58Bi alloy. Mater. Sci. Eng. A 744, 560–569 (2019).
W. Wang, R. Kang, S. Gao, and R. Wang, Study on Warpage of the AlSiC Substrate in Reflow Soldering Process of the IGBT Module. Paper presented at the 2022 2nd Int. Conf. on Electr., Electron. and Comput. Tech. (EECT), Shanghai, China, 25-27 March (2022).
Acknowledgments
The work is financially supported by the Ministry of Higher Education under Fundamental Research Grant Scheme, FRGS (Grant number FRGS/1/2020/TK0/USM/03/6). The authors would also like to thank Universiti Sains Malaysia and Western Digital Sdn. Bhd. for providing technical support.
Author information
Authors and Affiliations
Corresponding author
Ethics declarations
Conflict of interest
The authors declare that they have no conflict of interest.
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
About this article
Cite this article
Lee, J.R., Chong, M.X., Abdul Aziz, M.S. et al. Numerical Analysis of the Thermal and Mechanical Performance of Cu Pillar Bumps During Reflow: Effects of Height and Solder Material. J. Electron. Mater. 53, 1169–1182 (2024). https://doi.org/10.1007/s11664-023-10782-3
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11664-023-10782-3