Abstract
In this study, high-temperature vulcanized silicone rubber filled with different concentrations of micro- and nano-sized silica were tested under synergistic exposure to multi-stress conditions for a time period of 5000 h separately under alternating current and direct current voltages. Different characterization methods were used to evaluate the degradation performance. After each aging cycle, leakage current was measured and hydrophobicity classifications were determined by using contact angle measurement and amethod proposed by the Swedish Transmission Research Institute. Scanning electron microscopic study and Fourier transform infrared spectroscopy were performed for each test sample. Mechanical performance was assessed by measuring hardness, tensile strength and elongation-at-break. An outcome of this investigation revealed that samples stressed with DC voltage experienced 20–30% degradation compared to AC-stressed samples under common environmental stresses. All hybrid composites were found more resistant to aging but to a different degree depending on the composition. The test sample designated as TS2 was found to offer the highest resistance to aging.
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E.A. Cherney and I.E.E.E. Trans, Dielectr. Electr. Insul. 12, 1108 (2005).
M. Akbar, R. Ullah, and S. Alam, Mater. Res. Express 6, 102 (2019).
M.T. Nazir, B.T. Phung, S. Yu, and S. Li, IEEE Trans. Dielectr. Electr. Insul. 25, 2076 (2018).
M.T. Nazir and B.T. Phung, High voltage 3, 295 (2018).
Rochow, E. G. The chemistry of silicon: Pergamon International Library of Science, Technology, Engineering and Social Studies Vol. 9 (Elsevier, 2013).
M.T. Nazir, B.T. Phung, and M. Hoffman, IEEE Trans. Dielectr. Electr. Insul. 23, 2804 (2016).
Y. Zhu, Polym. Test 74, 14 (2019).
Hackam, R. (1999). IEEE Trans. Dielectr. Electr. Insul 6, 557 (1999).
Gubanski, S. M. In 1988 Fifth International Conference on Dielectric Materials, Measurements and Applications (1988, June), pp. 37-40.
Gorur, R. S., Gedach, D. W., & Thallam, R. S. In 1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena (1991, October). Pp. 268-273.
Ching, Y. C., Gunathilake, T. U., Ching, K. Y., Chuah, C. H., Sandu, V., Singh, R., & Liou, N. S. In Durability and Life Prediction in Biocomposites, Fibre-Reinforced Composites and Hybrid Composites (2019), pp. 407-426.
Fourmigue, J. M., Noel, M., & Riquel, G. In Proceedings of 1995 Conference on Electrical Insulation and Dielectric Phenomena (1995, October), pp. 404-407.
Olave, C., Romero, E., Trinidad, P., Sundararajan, R., & Trepanier, B. In IEEE Power Engineering Society General Meeting (2005) pp. 1006-1012.
R. Sundararajan, C. Olave, E. Romero, and B. Trepanier, IEEE Trans. Power Del. 22, 1079 (2007).
G. Momen and M. Farzaneh, Rev. Adv. Mater. Sci 27, 1 (2011).
S. Ansorge, F. Schmuck, and K.O. Papailiou, IEEE Trans. Dielectr. Electr. Insul. 22, 979 (2015).
B.Y.T.M.J. Venkatesulu and M. Thomas, J. IEEE Trans. Dielectr. Electr. Insul 17, 615 (2010).
S.S. Ray and M. Okamoto, Prog. Polym. Sci. 28, 1539 (2003).
Ullah, R., Akbar, M., & Amin, S. Appl. Nanosci., 1 (2020).
El-Hag, A. H., Jayaram, S. H., & Cherney, E. A. In The 17th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2004. pp. 385-388.
M. Akbar, R. Ullah, and I. Qazi, Eng. Fail. Anal. 110, 104449 (2020).
M.T. Nazir, B.T. Phung, M. Hoffman, S. Yu, and S. Li, Mater. Lett. 209, 421 (2019).
R. Chakraborty and B.S. Reddy, IEEE Trans. Dielectr. Electr. Insul. 24, 1751 (2017).
https://www.q-lab.com/documents/public/d6f438b3-dd28-4126-b3fd-659958759358.pdf
Pakistan meteorological department. [Online]. Available: http://www.pmd.gov.pk/ [19.12.2018]
H.M. Schneider, W.W. Guidi, J.T. Burnham, R.S. Gorur, and J.F. Hall, IEEE Trans. Power Del. 8, 325 (1993).
STRI Hydrophobicity Classification Guide, 92/1, 1992.
Standard, A. S. T. M. (2006). D1708: Standard Test Method for Tensile Properties of Plastics by Use of Microtensile Specimens.
A.S.T.M. Standard, D2240 (West Conshohoken, PA, USA: ASTM International, 2005).
N. Grassie and G. Scott, Polymer degradation and stabilization (New York: Cambridge University Press, 1985).
J.W. Chang and R.S. Gorur, IEEE Trans. Dielectr. Electr. Insul. 1, 1039 (1994).
R.S. Gorus, E.A. Cherney, and R. Hackam, IEEE Trans. Power Del. 3, 1892 (1988).
L.H. Meyer, E.A. Cherney, and S.H. Jayaram, IEEE Electr. Insul. Mag 20, 13 (2004).
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Akbar, M., Ullah, R. & Abdul Karim, M.R. Interpreting Surface Degradation of HTV Silicone Rubber Filled with Micro/Nano-Silica Under AC and DC Voltages. J. Electron. Mater. 49, 5399–5410 (2020). https://doi.org/10.1007/s11664-020-08265-w
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DOI: https://doi.org/10.1007/s11664-020-08265-w